BS E9007:1975

Withdrawn

Specification for harmonized system of quality assessment for electronic components: Basic specification: Sampling plans and procedures for inspection by attributes

Available format(s)

Hardcopy , PDF

Withdrawn date

04-11-2009

Language(s)

English

Published date

31-01-1975

Publisher

British Standards Institution

Interprets BS 6001 (and IEC 60410) clauses as applied to specifications in harmonized system of quality assessment for electronic components.

Committee	W/-
DevelopmentNote	Also numbered as CECC 00007:1973 (01/2006) Reviewed and confirmed by BSI, January 2008. (12/2007)
DocumentType	Standard
Pages	8
PublisherName	British Standards Institution
Status	Withdrawn
Supersedes	BS CECC 00007(1973) : LATEST

BS EN 111000:1993	Harmonized system of quality assessment for electronic components. Generic specification: cathode ray tubes
BS EN 114000:1993	Harmonized system of quality assessment for electronic components: generic specification: photomultiplier tubes
BS CECC 30301 024:1981	Harmonized detail specification for fixed aluminium electrolytic capacitors (long-life grade). Non-solid electrolyte. Cylindrical, polar insulated metallic case, clamp or stud mounting screw terminations. Full plus additional assessment level
BS CECC 20000:1983	Harmonized system of quality assessment for electronic components: generic specification: semiconductor optoelectronic and liquid crystal devices
BS CECC 90000:1985	Harmonized system of quality assessment for electronic components. Generic specification: monolithic integrated circuits
BS EN 135000:1993	Harmonized system of quality assessment for electronic components. Generic specification: travelling wave amplifier tubes
BS EN 175300:1997	Harmonized system of quality assessment for electronic components. Sectional specification:rectangular connectors for frequencies below 3 MHz
BS CECC 46000:1978	Harmonized system of quality assessment for electronic components: generic specification: cold cathode indicator tubes
BS CECC 63000:1990	Harmonized system of quality assessment for electronic components. Generic specification: film and hybrid integrated circuits
BS CECC 41000:1977	Harmonized system of quality assessment for electronic components: generic specification for potentiometers
BS CECC 50000:1987	Harmonized system of quality assessment for electronic components. Generic specification: discrete semiconductor devices
BS EN 112000:1997	Harmonized system of quality assessment for electronic components. Generic specification: image converter and image intensifier tubes
BS EN 136000:1993	Harmonized system of quality assessment for electronic components: generic specification: magnetrons
EN 112000:1992	Generic Specification: Image converter and image intensifier tubes
BS EN 125200:1993	Harmonized system of quality assessment for electronic components: sectional specification: magnetic oxide cores for linear transformers
BS CECC 75100:1984	Harmonized system of quality assessment for electronic components. Sectional specification: two-part and edge socket connectors for printed board application
BS CECC 42000:1978	Harmonized system of quality assessment for electronic components: generic specification: varistors
BS EN 113000:1993	Harmonized system of quality assessment for electronic components. Generic specification: camera tubes
BS EN 190000:1996	Harmonized system of quality assessment for electronic components. Generic specification: monolithic integrated circuits
BS CECC 45000:1977	Specification for harmonized system of quality assessment for electronic components: generic specification: space-charge controlled tubes
EN 190000:1995	Generic Specification: Monolithic integrated circuits

BS 6001(1972) : AMD 5054

SAMPLING PROCEDURES FOR INSPECTION BY ATTRIBUTES - SPECIFICATION FOR SAMPLING PLANS INDEXED BY ACCEPTABLE QUALITY LEVEL (AQL) FOR LOT - BY - LOT INSPECTION