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BS EN 112000:1997

BS EN 112000:1997

Current

Current

The latest, up-to-date edition.

Harmonized system of quality assessment for electronic components. Generic specification: image converter and image intensifier tubes

Available format(s)

Hardcopy , PDF

Language(s)

English

Published date

31-12-1980

Publisher

British Standards Institution

FOREWORD
PREFACE
SECTION 1 - SCOPE
SECTION 2 - GENERAL
2.1 Order of precedence
2.2 Related documents
2.3 Units, symbols and terminology
2.4 Marking
SECTION 3 - QUALITY ASSESSMENT PROCEDURES
3.1 Primary stage of manufacture
3.2 Structurally similar components
3.3 Qualification approval procedure
3.4 Supplementary procedure for qualification approval
3.5 Quality conformance inspection
3.6 Sampling requirements for small lots or for expensive
      devices
3.7 Re-submission of rejected lots
3.8 Certified test records
3.9 Delayed delivery
3.10 Unchecked parameters
3.11 Periodic Inspection
3.12 Release for delivery before the completion of
      Group B tests
SECTION 4 - TEST AND MEASUREMENT PROCEDURES
4.1 Alternative test methods
4.2 Standard conditions for testing
4.3 Test equipment
4.4 Visual inspection
4.5 Dimensions
4.6 Electrical and optical test and measurement procedures
4.7 Mechanical test and measurement procedures
4.8 Environmental test and measurement procedures
4.9 Endurance test and measurement procedures

General information, quality assessment procedure and test and measurement information.

Committee
W/-
DevelopmentNote
Renumbers and supersedes BS CECC 12000(1981) 1997 version incorporates amendment 9605 to BS CECC 12000(1981) Supersedes 75/24369 DC (09/2003)
DocumentType
Standard
Pages
26
PublisherName
British Standards Institution
Status
Current
Supersedes

Standards Relationship
EN 112000:1992 Identical
NEN EN 112000 : 1997 Identical
DIN EN 112000:1996-10 Identical

BS E9006(1976) : LATEST HARMONISED SYSTEM OF QUALITY ASSESSMENT FOR ELECTRONIC COMPONENTS. BASIC SPECIFICATION. ENVIRONMENTAL PROCEDURES
IEC 60134:1961 Rating systems for electronic tubes and valves and analogous semiconductor devices
BS E9007:1975 Specification for harmonized system of quality assessment for electronic components: Basic specification: Sampling plans and procedures for inspection by attributes
IEC 60306-1:1969 Measurement of photosensitive devices - Part 1: Basic recommendations
BS E9000-1(1977) : LATEST
BS 4727(1971) : LATEST
BS 6001(1972) : AMD 5054 SAMPLING PROCEDURES FOR INSPECTION BY ATTRIBUTES - SPECIFICATION FOR SAMPLING PLANS INDEXED BY ACCEPTABLE QUALITY LEVEL (AQL) FOR LOT - BY - LOT INSPECTION
BS E9000-2(1978) : LATEST
CECC 00400 : 86 ERRATUM 92 HANDBOOK FOR THE PRODUCTION OF CECC DOCUMENTS

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Hardcopy - English
PDF - English
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