Non-destructive testing. X-ray diffraction from polycrystalline and amorphous materials General principles

Available format(s)

Hardcopy , PDF

Language(s)

English

Published date

20-03-2003

Publisher

British Standards Institution

Foreword
Introduction
1 Scope
2 Normative references
3 Terms and definitions
4 General principles of X-ray powder diffraction (XRPD)
5 Meaning of the word "powder" in terms of X-ray diffraction
6 Characteristics of powder diffraction line profiles
7 Type of analysis
  7.1 General
  7.2 Phase identification (also referred to as "Qualitative
       phase analysis")
  7.3 Quantitative phase analysis
  7.4 Estimation of the crystalline and amorphous fractions
  7.5 Determination of lattice parameters
  7.6 Determination of crystal structures
  7.7 Refinement of crystal structures
  7.8 Characterisation of crystallographic texture
  7.9 Macrostress determination
  7.10 Analysis of crystalline size and microstrain
       7.10.1 General
       7.10.2 Determination of crystallite size (size of
              coherently scattering domains)
       7.10.3 Determination of microstrains
  7.11 Electron radial distribution function
8 Special experimental conditions
Annex A (informative) Relationships between the XRPD standards
Bibliography

Specifies the general principles of X-ray diffraction from polycrystalline and amorphous materials.

This European Standard defines the general principles of X-ray diffraction from polycrystalline and amorphous materials. This materials testing method has traditionally been referred to as \'X-ray Powder Diffraction (XRPD)\', and is now applied to powders, bulk materials, thin film, and others. As the method can be used for various types of materials and to obtain a large variety of information, this standard reviews a large number of types of analysis but remains non-exhaustive.

Committee	WEE/46
DevelopmentNote	Supersedes 00/709693 DC (04/2003) Reviewed and confirmed by BSI, December 2008. (11/2008)
DocumentType	Standard
Pages	16
PublisherName	British Standards Institution
Status	Current
Supersedes	00/709693 DC : DRAFT JUN 2000

Standards	Relationship
NS EN 13925-1 : 1ED 2003	Identical
SN EN 13925-1 : 2003	Identical
NF EN 13925-1 : 2003	Identical
UNE-EN 13925-1:2006	Identical
EN 13925-1:2003	Identical
I.S. EN 13925-1:2003	Identical
UNI EN 13925-1 : 2006	Identical
NBN EN 13925-1 : 2003	Identical
NEN EN 13925-1 : 2003	Identical
DIN EN 13925-1:2003-07	Identical

PD 6699-1:2007

Nanotechnologies Good practice guide for specifying manufactured nanomaterials

ISO 5725-1:1994	Accuracy (trueness and precision) of measurement methods and results — Part 1: General principles and definitions
EN 13925-2:2003	Non-destructive testing - X-ray diffraction from polycrystalline and amorphous materials - Part 2: Procedures

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BS EN 13925-1:2003

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Table of Contents

Abstract

Scope

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International Equivalents

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