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BS EN 60749-11:2002

Current

Current

The latest, up-to-date edition.

Semiconductor devices. Mechanical and climatic test methods Rapid change of temperature. Two-fluid-bath method

Available format(s)

Hardcopy , PDF

Language(s)

English

Published date

24-10-2003

Foreword
INTRODUCTION
1 Scope
2 Normative references
3 Terms and definitions
4 Test apparatus
5 Procedure
6 Summary
Annex ZA (normative) Normative references to international
         publications with their corresponding European
         publications

Describes the rapid change of temperature test method and the two-fluid-bath method. It is applicable to all semiconductor devices.

Defines the rapid change of temperature test method and the two-fluid-bath method. This test method may also be used, employing fewer cycles, to test the effect of immersion in heated liquids that are used for the purpose of cleaning devices. This test is applicable to all semiconductor devices. It is considered destructive unless otherwise detailed in the relevant specification. The contents of the corrigenda of January 2003 and August 2003 have been included in this copy.

Committee
EPL/47
DevelopmentNote
Supersedes 00/203570 DC (10/2002) Supersedes BS EN 60749. (09/2005)
DocumentType
Standard
Pages
12
PublisherName
British Standards Institution
Status
Current
Supersedes

Standards Relationship
IEC 60749-11:2002 Identical
UNE-EN 60749-11:2003 Identical
DIN EN 60749-11:2003-04 Identical
I.S. EN 60749-11:2002 Identical
NF EN 60749-11 : 2002 Identical
NBN EN 60749-11 : 2003 Identical
EN 60749-11:2002 Identical

IEC 60749-3:2017 Semiconductor devices - Mechanical and climatic test methods - Part 3: External visual examination
EN 60749-3:2017 Semiconductor devices - Mechanical and climatic test methods - Part 3: External visual examination
IEC 60068-2-14:2009 Environmental testing - Part 2-14: Tests - Test N: Change of temperature
EN 60068-2-14:2009 Environmental testing - Part 2-14: Tests - Test N: Change of temperature

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