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BS EN 60749-26:2014

Superseded
Superseded

A superseded Standard is one, which is fully replaced by another Standard, which is a new edition of the same Standard.

View Superseded by
superseded

A superseded Standard is one, which is fully replaced by another Standard, which is a new edition of the same Standard.

Semiconductor devices. Mechanical and climatic test methods Electrostatic discharge (ESD) sensitivity testing. Human body model (HBM)
Available format(s)

Hardcopy , PDF

Superseded date

30-04-2016

Language(s)

English

Published date

30-06-2014

Publisher

British Standards Institution

1 Scope
2 Normative references
3 Terms and definitions
4 Apparatus and required equipment
5 Stress test equipment qualification
  and routine verification
6 Classification procedure
7 Failure criteria
8 Component classification
Annex A (informative) - HBM test method flow chart
Annex B (informative) - HBM test equipment parasitic
        properties
Annex C (informative) - Example of testing a product
        using Table 2, Table 3, or Table 2 with a
        two-pin HBM tester
Annex D (informative) - Examples of coupled
        non-supply pin pairs
Annex ZA (normative) - Normative references to international
         publications with their corresponding European
         publications

Specifies the procedure for testing, evaluating, and classifying components and microcircuits according to their susceptibility (sensitivity) to damage or degradation by exposure to a defined human body model (HBM) electrostatic discharge (ESD).

This standard establishes the procedure for testing, evaluating, and classifying components and microcircuits according to their susceptibility (sensitivity) to damage or degradation by exposure to a defined human body model (HBM) electrostatic discharge (ESD).

The purpose (objective) of this standard is to establish a test method that will replicate HBM failures and provide reliable, repeatable HBM ESD test results from tester to tester, regardless of component type. Repeatable data will allow accurate classifications and comparisons of HBM ESD sensitivity levels.

ESD testing of semiconductor devices is selected from this test method, the machine model (MM) test method (see IEC 60749-27) or other ESD test methods in the IEC 60749 series. The HBM and MM test methods produce similar but not identical results; unless otherwise specified, this test method is the one selected.

Committee
EPL/47
DevelopmentNote
Supersedes BS EN 60749. Supersedes 05/30128291 DC. (10/2006) Supersedes 11/30250232 DC. (06/2014)
DocumentType
Standard
Pages
44
PublisherName
British Standards Institution
Status
Superseded
SupersededBy
Supersedes

Standards Relationship
I.S. EN 60749-26:2014 Identical
EN 60749-26:2014 Identical
IEC 60749-26:2013 Identical
NBN EN 60749-26 : 2014 Identical
DIN EN 60749-26 : 2014 Identical
NF EN 60749-26 : 2014 Identical

IEC 60749-27:2006+AMD1:2012 CSV Semiconductor devices - Mechanical and climatic test methods - Part27: Electrostatic discharge (ESD) sensitivity testing - Machine model (MM)
EN 60749-27:2006/A1:2012 SEMICONDUCTOR DEVICES - MECHANICAL AND CLIMATIC TEST METHODS - PART 27: ELECTROSTATIC DISCHARGE (ESD) SENSITIVITY TESTING - MACHINE MODEL (MM)

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PDF - English
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