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BS EN 60749-31:2003

Current
Current

The latest, up-to-date edition.

Semiconductor devices. Mechanical and climatic test methods Flammability of plastic-encapsulated devices (internally induced)
Available format(s)

Hardcopy , PDF

Language(s)

English

Published date

04-07-2003

Foreword
INTRODUCTION
1 Scope and object
2 Normative references
3 Test procedure

Applies to semiconductor devices (discrete devices and integrated circuits). It determines whether the device ignites due to internal heating caused by excessive overloads.

Applicable to semiconductor devices (discrete devices and integrated circuits), this test determines whether the device ignites due to internal heating caused by excessive overloads. The contents of the corrigendum of August 2003 have been included in this copy.

Committee
EPL/47
DevelopmentNote
Supersedes BS EN 60749. (09/2005)
DocumentType
Standard
Pages
8
PublisherName
British Standards Institution
Status
Current
Supersedes

Standards Relationship
EN 60749-31:2003 Identical
SN EN 60749-31 : 2003 Identical
DIN EN 60749-31:2003-12 Identical
I.S. EN 60749-31:2003 Identical
UNE-EN 60749-31:2004 Identical
NBN EN 60749-31 : 2004 Identical
NF EN 60749-31 : 2003 Identical
IEC 60749-31:2002 Identical
IEC 61073-1:2009 Identical

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