Semiconductor devices. Mechanical and climatic test methods Damp heat, steady state, highly accelerated stress test (HAST)

Available format(s)

Hardcopy , PDF

Language(s)

English

Published date

28-11-2017

Publisher

British Standards Institution

FOREWORD
1 Scope
2 Normative references
3 Terms and definitions
4 HAST test - General remarks
5 Test apparatus
6 Test conditions
7 Procedure
8 Failure criteria
9 Safety
10 Summary
Annex ZA (normative) - Normative references to
international publications with their
corresponding European publications

Describes a highly accelerated temperature and humidity stress test (HAST) for the purpose of evaluating the reliability of non-hermetic packaged semiconductor devices in humid environments.

This part of IEC 60749 provides a highly accelerated temperature and humidity stress test (HAST) for the purpose of evaluating the reliability of non-hermetic packaged semiconductor devices in humid environments.

Committee	EPL/47
DevelopmentNote	Supersedes 00/203564 DC (09/2002) Supersedes BS EN 60749. (09/2005) Supersedes 16/30341341 DC. (12/2017)
DocumentType	Standard
Pages	16
PublisherName	British Standards Institution
Status	Current
Supersedes	BS EN 60749-4:2002

Standards	Relationship
UNE-EN 60749-4:2003	Identical
NBN EN 60749-4 : 2003	Identical
I.S. EN 60749-4:2017	Identical
IEC 60749-4:2017	Identical
EN 60749-4:2017	Identical
DIN EN 60749-4:2016-06 (Draft)	Identical
NF EN 60749-4 : 2002	Identical

IEC 60749-5:2017	Semiconductor devices - Mechanical and climatic test methods - Part 5: Steady-state temperature humidity bias life test
EN 60749-5:2017	Semiconductor devices - Mechanical and climatic test methods - Part 5: Steady-state temperature humidity bias life test

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BS EN 60749-4:2017

Semiconductor devices. Mechanical and climatic test methods Damp heat, steady state, highly accelerated stress test (HAST)

Table of Contents

Abstract

Scope

General Product Information

International Equivalents

Standards Referencing This Book

Category

Subcategory