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BS EN 60749-6:2002

Superseded
Superseded

A superseded Standard is one, which is fully replaced by another Standard, which is a new edition of the same Standard.

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superseded

A superseded Standard is one, which is fully replaced by another Standard, which is a new edition of the same Standard.

Semiconductor devices. Mechanical and climatic test methods Storage at high temperature
Available format(s)

Hardcopy , PDF

Superseded date

01-01-2017

Language(s)

English

Published date

10-09-2002

Aims at testing and determining the effect on all semiconductor electronic devices of storage at elevated temperature without electrical stress applied. This test is considered non-destructive. The contents of the corrigendum of August 2003 have been included in this copy.

Committee
EPL/47
DocumentType
Standard
Pages
8
PublisherName
British Standards Institution
Status
Superseded
SupersededBy
Supersedes

Standards Relationship
EN 60749-6:2002 Identical
IEC 60749-6:2002 Identical
I.S. EN 60749-6:2017 Identical
NF EN 60749-6 : 2002 Identical
IEC 60749-6:2017 Identical
EN 60749-6:2017 Identical
UNE-EN 60749-6:2003 Identical
DIN EN 60749-6:2016-09 (Draft) Identical

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