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BS EN 60749-7:2011

BS EN 60749-7:2011

Current

Current

The latest, up-to-date edition.

Semiconductor devices. Mechanical and climatic test methods Internal moisture content measurement and the analysis of other residual gases

Available format(s)

Hardcopy , PDF

Language(s)

English

Published date

30-09-2011

Publisher

British Standards Institution

FOREWORD
1 Scope
2 Normative references
3 Terms and definitions
4 Test apparatus
5 Procedure
6 Failure criteria
7 Implementation
8 Summary
Bibliography

Describes the testing and measurement of water vapour and other gas content of the atmosphere inside a metal or ceramic hermetically sealed device.

This International Standard specifies the testing and measurement of water vapour and other gas content of the atmosphere inside a metal or ceramic hermetically sealed device. The test is used as a measure of the quality of the sealing process and to provide information about the long-term chemical stability of the atmosphere inside the package. It is applicable to semiconductor devices sealed in such a manner but generally only used for high reliability applications such as military or aerospace. This test is destructive.

Committee
EPL/47
DevelopmentNote
Supersedes 00/203560 DC (09/2002) Supersedes BS EN 60749. (09/2005) Supersedes 09/30208079 DC. (09/2011)
DocumentType
Standard
Pages
16
PublisherName
British Standards Institution
Status
Current
Supersedes

Standards Relationship
I.S. EN 60749-7:2011 Identical
NF EN 60749-7 : 2012 Identical
IEC 60749-7:2011 Identical
NBN EN 60749-7 : 2011 Identical
UNE-EN 60749-7:2003 Identical
DIN EN 60749-7:2012-02 Identical
EN 60749-7:2011 Identical

IEC 60749-8:2002 Semiconductor devices - Mechanical and climatic test methods - Part 8: Sealing

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Hardcopy - English
PDF - English
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