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BS EN 61747-1:2000

Current
Current

The latest, up-to-date edition.

Liquid crystal and solid-state display devices Generic specification
Available format(s)

Hardcopy , PDF

Language(s)

English

Published date

31-10-2003

Publisher

British Standards Institution

1 Scope
2 Normative references
3 Terminology
  3.1 Physical concepts
  3.2 General terms
  3.3 Terms related to ratings and characteristics
4 Technical aspects
  4.1 Order of precedence
  4.2 Terminology, units and symbols
  4.3 Preferred values of temperature, humidity and
       pressure
  4.4 Marking
       4.4.1 Device identification
       4.4.2 Device traceability
       4.4.3 Packing
  4.5 Categories of assessed quality
  4.6 Screening
  4.7 Handling
5 Quality assessment procedures
  5.1 Eligibility for qualification approval
       5.1.1 Primary stage of manufacture
  5.2 Commercially confidential information
  5.3 Formation of inspection lots
  5.4 Structurally similar devices
  5.5 Granting of qualification approval
  5.6 Quality conformance inspection
       5.6.1 Division into groups and subgroups
       5.6.2 Inspection requirements
       5.6.3 Supplementary procedure for reduced
             inspection
       5.6.4 Sampling requirements for small lots
       5.6.5 Certified records of released lots
             (CRRL)
       5.6.6 Delivery of devices subjected to
             destructive or non-destructive tests
       5.6.7 Delayed deliveries
       5.6.8 Supplementary procedure for deliveries
  5.7 Statistical sampling procedures
       5.7.1 AQL sampling plans
       5.7.2 LTPD sampling plans
  5.8 Endurance tests
  5.9 Endurance tests where the failure rate is
       specified
       5.9.1 General
       5.9.2 Selection of samples
       5.9.3 Failure
       5.9.4 Endurance test time and sample size
       5.9.5 Procedure to be used if the number of
             observed failures exceeds the
             acceptance number
  5.10 Accelerated test procedures
  5.11 Capability approval
6 Test and measurement procedures
  6.1 Standard atmospheric conditions for electrical
       and optical measurements
  6.2 Physical examination
       6.2.1 Visual examination
       6.2.2 Dimensions
       6.2.3 Permanence of marking
  6.3 Electrical and optical measurements
       6.3.1 General conditions and precautions
  6.4 Environmental tests
Annex A (informative) Cross references index
Annex B (informative) Example of outline drawings of liquid
                      crystal display cells
Annex C (normative) Orientation of LCD modules
Annex D (normative) Lot tolerance percentage defective
                    (LTPD) sampling plans
Tables

Generic specification defining general procedures for quality assessment for IECQ use and general rules for measuring methods of electrical and optical characteristics, climatic and mechanical tests and endurance tests.

Committee
EPL/100
DevelopmentNote
Renumbers and supersedes BS IEC 61747-1. 2000 version incorporates amendment 10788 to BS IEC 61747-1. Also numbered as IEC 61747-1. Supersedes 01/201646 DC & 93/203880 DC. (01/2006)
DocumentType
Standard
Pages
46
PublisherName
British Standards Institution
Status
Current
Supersedes

IEC 61747-3-1:2015 Liquid crystal display devices - Part 3-1: Liquid crystal display (LCD) cells - Blank detail specification
IEC 60068-1:2013 Environmental testing - Part 1: General and guidance
IEC 60191-1:2007 Mechanical standardization of semiconductor devices - Part 1: General rules for the preparation of outline drawings of discrete devices
EN 61747-3-1 : 2006 LIQUID CRYSTAL DISPLAY DEVICES - PART 3-1: LIQUID CRYSTAL DISPLAY (LCD) CELLS - BLANK DETAIL SPECIFICATION
EN 60068-2-1:2007 Environmental testing - Part 2-1: Tests - Test A: Cold
ISO 2859:1974 Sampling procedures and tables for inspection by attributes
ISO 1101:2017 Geometrical product specifications (GPS) — Geometrical tolerancing — Tolerances of form, orientation, location and run-out
EN 60068-1:2014 Environmental testing - Part 1: General and guidance
IEC 61747-2-1:2013 Liquid crystal display devices - Part 2-1: Passive matrix monochrome LCD modules - Blank detail specification
EN 60749-1:2003 Semiconductor devices - Mechanical and climatic test methods - Part 1: General
EN 61747-4:2012 Liquid crystal display devices - Part 4: Liquid crystal display modules and cells - Essential ratings and characteristics
IEC 60747-10:1991 Semiconductor devices - Part 10: Generic specification for discrete devices and integrated circuits
EN 61747-2-1:2013 Liquid crystal display devices - Part 2-1: Passive matrix monochrome LCD modules - Blank detail specification
IEC 60747-5:1992 Semiconductor devices - Discrete devices and integrated circuits -Part 5: Optoelectronic devices
IEC 60027-1:1992 Letters symbols to be used in electrical technology - Part 1: General
IEC 60191-2:2012 DB Mechanical standardization of semiconductor devices - Part 2: Dimensions
IEC 61747-5:1998 Liquid crystal and solid-state display devices - Part 5: Environmental, endurance and mechanical test methods
IEC 60410:1973 Sampling plans and procedures for inspection by attributes
HD 323.1 : 200S2 BASIC ENVIRONMENTAL TESTING PROCEDURES - GENERAL AND GUIDANCE
ISO 8601:2004 Data elements and interchange formats Information interchange Representation of dates and times
IEC 60617-1:1985 Graphical symbols for diagrams. Part 1: General information, general index. Cross-reference tables
IEC 60747-1:2006+AMD1:2010 CSV Semiconductor devices - Part 1: General
IEC 60749:1996+AMD1:2000+AMD2:2001 CSV Semiconductor devices - Mechanical and climatic test methods
IEC 60748-1:2002 Semiconductor devices - Integrated circuits - Part 1: General
IEC 60068-2-1:2007 Environmental testing - Part 2-1: Tests - Test A: Cold
IEC 61747-4:2012 Liquid crystal display devices - Part 4: Liquid crystal display modules and cells - Essential ratings and characteristics
HD 245.1 : 200S3 LETTER SYMBOLS TO BE USED IN ELECTRICAL TECHNOLOGY - GENERAL
EN 28601 : 1992 DATA ELEMENTS AND INTERCHANGE FORMATS - INFORMATION INTERCHANGE - REPRESENTATION OF DATES AND TIMES
EN 61747-5:1998 Liquid crystal and solid-state display devices - Part 5: Environmental, endurance and mechanical test methods
IEC 60191-3:1999 Mechanical standardization of semiconductor devices - Part 3: General rules for the preparation of outline drawings of integrated circuits
HD 323.2.1 : 200S2 BASIC ENVIRONMENTAL TESTING PROCEDURES - TESTS - TEST A: COLD

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