IEC 60950-1:2005+AMD1:2009+AMD2:2013 CSV
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Information technology equipment - Safety - Part 1: General requirements |
IEC GUIDE 107:2014
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Electromagnetic compatibility - Guide to the drafting of electromagnetic compatibility publications |
EN 60825-1:2014/AC:2017-06
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SAFETY OF LASER PRODUCTS - PART 1: EQUIPMENT CLASSIFICATION AND REQUIREMENTS (IEC 60825-1:2014) |
IEC 62007-1:2015
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Semiconductor optoelectronic devices for fibre optic system applications - Part 1: Specification template for essential ratings and characteristics |
IEC 60749-25:2003
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SEMICONDUCTOR DEVICES - MECHANICAL AND CLIMATIC TEST METHODS - PART 25: TEMPERATURE CYCLING |
IEC 61300-2-48:2009
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FIBRE OPTIC INTERCONNECTING DEVICES AND PASSIVE COMPONENTS - BASIC TEST AND MEASUREMENT PROCEDURES - PART 2-48: TESTS - TEMPERATURE-HUMIDITY CYCLING |
IEC 61290-1-3:2015
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Optical amplifiers - Test methods - Part 1-3: Power and gain parameters - Optical power meter method |
IEC 60749-11:2002
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SEMICONDUCTOR DEVICES - MECHANICAL AND CLIMATIC TEST METHODS - PART 11: RAPID CHANGE OF TEMPERATURE - TWO-FLUID-BATH METHOD |
EN 60950-1:2006/A2:2013
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INFORMATION TECHNOLOGY EQUIPMENT - SAFETY - PART 1: GENERAL REQUIREMENTS (IEC 60950-1:2005/A2:2013, MODIFIED) |
IEC 60825-1:2014
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Safety of laser products - Part 1: Equipment classification and requirements |
IEC 62007-2:2009
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Semiconductor optoelectronic devices for fibre optic system applications - Part 2: Measuring methods |
EN 60749-11 : 2002
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SEMICONDUCTOR DEVICES - MECHANICAL AND CLIMATIC TEST METHODS - PART 11: RAPID CHANGE OF TEMPERATURE - TWO-FLUID-BATH METHOD |
IEC 60749-26:2013
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Semiconductor devices - Mechanical and climatic test methods - Part 26: Electrostatic discharge (ESD) sensitivity testing - Human body model (HBM) |
EN 60749-10 : 2002
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SEMICONDUCTOR DEVICES - MECHANICAL AND CLIMATIC TEST METHODS - PART 10: MECHANICAL SHOCK |
IEC 60749-7:2011
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SEMICONDUCTOR DEVICES - MECHANICAL AND CLIMATIC TEST METHODS - PART 7: INTERNAL MOISTURE CONTENT MEASUREMENT AND THE ANALYSIS OF OTHER RESIDUAL GASES |
EN 61300-2-4 : 1997
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FIBRE OPTIC INTERCONNECTING DEVICES AND PASSIVE COMPONENTS BASIC TEST AND MEASUREMENT PROCEDURES - PART 2-4: TESTS - FIBRE/CABLE RETENTION (IEC 61300-2-4:1995) |
IEC 60749-6:2017
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SEMICONDUCTOR DEVICES - MECHANICAL AND CLIMATIC TEST METHODS - PART 6: STORAGE AT HIGH TEMPERATURE |
IEC 62148-1:2017
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Fibre optic active components and devices - Package and interface standards - Part 1: General and guidance |
EN 60749-7 : 2011
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SEMICONDUCTOR DEVICES - MECHANICAL AND CLIMATIC TEST METHODS - PART 7: INTERNAL MOISTURE CONTENT MEASUREMENT AND THE ANALYSIS OF OTHER RESIDUAL GASES |
EN 60749-26 : 2014
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SEMICONDUCTOR DEVICES - MECHANICAL AND CLIMATIC TEST METHODS - PART 26: ELECTROSTATIC DISCHARGE (ESD) SENSITIVITY TESTING - HUMAN BODY MODEL (HBM) (IEC 60749-26:2013) |
IEC 60747-5-1:1997+AMD1:2001+AMD2:2002 CSV
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Discrete semiconductor devices and integrated circuits - Part 5-1: Optoelectronic devices - General |
IEC 61300-2-4:1995
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FIBRE OPTIC INTERCONNECTING DEVICES AND PASSIVE COMPONENTS - BASIC TEST AND MEASUREMENT PROCEDURES - PART 2-4: TESTS - FIBRE/CABLE RETENTION |
IEC 60749-10:2002
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Semiconductor devices - Mechanical and climatic test methods - Part 10: Mechanical shock |
EN 60749-25 : 2003
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SEMICONDUCTOR DEVICES - MECHANICAL AND CLIMATIC TEST METHODS - PART 25: TEMPERATURE CYCLING |
IEC 62149-1:2011
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FIBRE OPTIC ACTIVE COMPONENTS AND DEVICES - PERFORMANCE STANDARDS - PART 1: GENERAL AND GUIDANCE |
IEC 61300-2-19:2012
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FIBRE OPTIC INTERCONNECTING DEVICES AND PASSIVE COMPONENTS - BASIC TEST AND MEASUREMENT PROCEDURES - PART 2-19: TESTS - DAMP HEAT (STEADY STATE) |
EN 61300-2-19 : 2013
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FIBRE OPTIC INTERCONNECTING DEVICES AND PASSIVE COMPONENTS - BASIC TEST AND MEASUREMENT PROCEDURES - PART 2-19: TESTS - DAMP HEAT (STEADY STATE) (IEC 61300-2-19:2012) |
IEC 60749-12:2002
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SEMICONDUCTOR DEVICES - MECHANICAL AND CLIMATIC TEST METHODS - PART 12: VIBRATION, VARIABLE FREQUENCY |
EN 61300-2-48 : 2009
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FIBRE OPTIC INTERCONNECTING DEVICES AND PASSIVE COMPONENTS - BASIC TEST AND MEASUREMENT PROCEDURES - PART 2-48: TESTS - TEMPERATURE-HUMIDITY CYCLING |
EN 60749-12 : 2002
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SEMICONDUCTOR DEVICES - MECHANICAL AND CLIMATIC TEST METHODS - PART 12: VIBRATION, VARIABLE FREQUENCY |