Integrated circuits. EMC evaluation of transceivers LIN transceivers

Available format(s)

Hardcopy , PDF

Language(s)

English

Published date

28-02-2017

Publisher

British Standards Institution

IEC 62228-2:2016 specifies test and measurement methods for EMC evaluation of LIN transceiver ICs under network condition. It defines test configurations, test conditions, test signals, failure criteria, test procedures, test setups and test boards. It is applicable for standard LIN transceiver ICs and ICs with embedded LIN transceiver and covers:
- the emission of RF disturbances,
- the immunity against RF disturbances,
- the immunity against impulses and
- the immunity against electrostatic discharges (ESD).

Committee	EPL/47
DevelopmentNote	Supersedes 14/30310470 DC. (03/2017)
DocumentType	Standard
Pages	46
PublisherName	British Standards Institution
Status	Current
Supersedes	14/30310470 DC : 0

Standards	Relationship
EN 62228-2:2017	Identical
IEC 62228-2:2016	Identical

EN 62132-4:2006	Integrated circuits - Measurement of electromagnetic immunity 150 kHz to 1 GHz - Part 4: Direct RF power injection method
IEC 62215-3:2013	Integrated circuits - Measurement of impulse immunity - Part 3: Non-synchronous transient injection method
EN 62215-3:2013	Integrated circuits - Measurement of impulse immunity - Part 3: Non-synchronous transient injection method
IEC 61967-1:2002	Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 1: General conditions and definitions
IEC 62132-4:2006	Integrated circuits - Measurement of electromagnetic immunity 150 kHz to 1 GHz - Part 4: Direct RF power injection method
ISO 7637-2:2011	Road vehicles Electrical disturbances from conduction and coupling Part 2: Electrical transient conduction along supply lines only
ISO 17987-6:2016	Road vehicles Local Interconnect Network (LIN) Part 6: Protocol conformance test specification
ISO 10605:2008	Road vehicles — Test methods for electrical disturbances from electrostatic discharge
EN 62132-1:2016	Integrated circuits - Measurement of electromagnetic immunity - Part 1: General conditions and definitions
EN 61967-1:2002	Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 1: General conditions and definitions
IEC 62132-1:2015	Integrated circuits - Measurement of electromagnetic immunity - Part 1: General conditions and definitions
EN 61967-4 : 2002 COR 2017	INTEGRATED CIRCUITS - MEASUREMENT OF ELECTROMAGNETIC EMISSIONS, 150 KHZ TO 1 GHZ - PART 4: MEASUREMENT OF CONDUCTED EMISSIONS - 1 OHM/150 OHM DIRECT COUPLING METHOD (IEC 61967-4:2002/COR1:2017)
IEC 61967-4:2002+AMD1:2006 CSV	Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 4: Measurement of conducted emissions - 1 Ω/150 Ω direct coupling method