SEMICONDUCTOR DEVICES - PART 1: GENERAL

Amended by

BS IEC 60747-1:2006+A1:2010

Available format(s)

Hardcopy , PDF

Language(s)

English

Published date

01-01-2006

Publisher

British Standards Institution

FOREWORD
1 Scope
2 Normative references
3 Terms and definitions
4 Letter symbols
5 Essential ratings and characteristics
6 Measuring methods
7 Acceptance and reliability of discrete devices
8 Electrostatic-sensitive devices
9 Product discontinuance notification
Annex A (informative) - Presentation of IEC 60747 and
IEC 60748
Annex B (informative) - Clause cross-references from the
first edition of IEC 60747-1(1983)
Bibliography

Provides the general requirements applicable to the discrete semiconductor devices and integrated circuits covered by the other parts of IEC 60747 and IEC 60748.

Committee	EPL/47
DevelopmentNote	Supersedes BS 6493-1.1(1984) and 04/30122195 DC. (07/2006) 2006 Edition Re-Issued in July 2010 & incorporates AMD 1 2010. Supersedes 09/30205407 DC. (07/2010)
DocumentType	Standard
Pages	46
PublisherName	British Standards Institution
Status	Current
Supersedes	BS 6493-1.1:1984 04/30122195 DC : DRAFT SEP 2004 09/30205407 DC : 0

Standards	Relationship
IEC 60747-1:2006+AMD1:2010 CSV	Identical

IEC 60050-131:2002	International Electrotechnical Vocabulary (IEV) - Part 131: Circuit theory
IEC 60050-702:1992	International Electrotechnical Vocabulary (IEV) - Part 702: Oscillations, signals and related devices
IEC 60134:1961	Rating systems for electronic tubes and valves and analogous semiconductor devices
IEC 60319:1999	Presentation and specification of reliability data for electronic components
IEC 60191-2:2012 DB	Mechanical standardization of semiconductor devices - Part 2: Dimensions
IEC 60469-1:1987	Pulse techniques and apparatus. Part 1: Pulse terms and definitions
IEC 60749-26:2013	Semiconductor devices - Mechanical and climatic test methods - Part 26: Electrostatic discharge (ESD) sensitivity testing - Human body model (HBM)
ISO 9000:2015	Quality management systems — Fundamentals and vocabulary
IEC 60050-521:2002	International Electrotechnical Vocabulary (IEV) - Part 521: Semiconductor devices and integrated circuits

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BS IEC 60747-1 : 2006

Current

Table of Contents

Abstract

General Product Information

International Equivalents

Standards Referencing This Book

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