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BS IEC 60747-14.3 : 2009

Current
Current

The latest, up-to-date edition.

SEMICONDUCTOR DEVICES - PART 14-3: SEMICONDUCTOR SENSORS - PRESSURE SENSORS
Available format(s)

Hardcopy , PDF

Language(s)

English

Published date

01-01-2009

FOREWORD
INTRODUCTION
1 Scope
2 Normative references
3 Terminology and letter symbols
  3.1 General terms
  3.2 Definitions
  3.3 Letter symbols
4 Essential ratings and characteristics
  4.1 General
  4.2 Ratings (limiting values)
  4.3 Characteristics
5 Measuring methods
  5.1 General
  5.2 Output voltage measurements
  5.3 Sensitivity (S)
  5.4 Temperature coefficient of sensitivity (alpha[S])
  5.5 Temperature coefficient of full-scale span (alphaV[FSS])
      and maximum temperature deviation of full-scale span
      (deltaV[FSS])
  5.6 Temperature coefficient of offset voltage (alphaV[OS])
      and (deltaV[OS])
  5.7 Pressure hysteresis of output voltage (H[ohp])
  5.8 Temperature hysteresis of output voltage (H[ohT])
Figure 1 - Basic circuit for measurement of output voltage

Provides requirements for semiconductor pressure sensors measuring absolute, gauge, or differential pressures.

Committee
EPL/47
DevelopmentNote
Supersedes 99/204500 DC. (10/2001) Supersedes 08/30181404 DC. (07/2009)
DocumentType
Standard
Pages
24
PublisherName
British Standards Institution
Status
Current
Supersedes

Standards Relationship
IEC 60747-14-3:2009 Identical

IEC 60747-14-1:2010 Semiconductor devices - Part 14-1: Semiconductor sensors - Generic specification for sensors
IEC 60747-1:2006+AMD1:2010 CSV Semiconductor devices - Part 1: General

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