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BS IEC 60747-5.1 : 97 AMD 13341

Superseded

Superseded

A superseded Standard is one, which is fully replaced by another Standard, which is a new edition of the same Standard.

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superseded

A superseded Standard is one, which is fully replaced by another Standard, which is a new edition of the same Standard.

DISCRETE SEMICONDUCTOR DEVICES AND INTEGRATED CIRCUITS - OPTOELECTRONIC DEVICES - GENERAL

Superseded date

24-12-2001

Published date

23-11-2012

FOREWORD
1 Scope
2 Normative references
3 Physical concepts
    3.1 (Electromagnetic) radiation
    3.2 Optical radiation
    3.3 Visible radiation
    3.4 Infrared radiation
    3.5 Ultraviolet radiation
    3.6 Light
    3.7 Photoelectric effect
4 Types of devices
    4.1 Semiconductor optoelectronic device
    4.2 Semiconductor photoemitter
    4.3 Semiconductor laser
    4.4 Light-emitting diode (LED)
    4.5 Infrared-emitting diode (IRED)
    4.6 (Semiconductor) photosensitive device
    4.7 (Semiconductor) photoresistor, photoconductive cell
    4.8 (Semiconductor) photoresistor, photoconductive
          cell
    4.9 Photoelement, photovoltaic cell
    4.10 Photodiode
    4.11 Phototransistor
    4.12 Photothyristor
    4.13 Photocoupler, optocoupler
5 General terms
    5.1 Optical axis
    5.2 Optical port (of a semiconductor optoelectronic
          device)
    5.3 (optical) cladding
6 Terms related to ratings and characteristics
    6.1 General
    6.2 Photoemitters
    6.3 Photosensitive devices
    6.4 Photocouplers, optocouplers
Annex A Cross references index

Concerned with terminology relative to the semiconductor optoelectronic devices.

Committee
EPL/47/3
DevelopmentNote
Renumbered and superseded by BS EN 60747-5-1 (01/2002)
DocumentType
Standard
PublisherName
British Standards Institution
Status
Superseded
SupersededBy

Standards Relationship
IEC 60747-5-1:1997+AMD1:2001+AMD2:2002 CSV Identical

IEC 60050-731:1991 International Electrotechnical Vocabulary (IEV) - Part 731: Optical fibre communication
IEC 60664-1:2007 Insulation coordination for equipment within low-voltage systems - Part 1: Principles, requirements and tests

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