SEMICONDUCTOR DEVICES - INTEGRATED CIRCUITS - DIGITAL INTEGRATED CIRCUITS - BLANK DETAIL SPECIFICATION FOR SINGLE SUPPLY INTEGRATED CIRCUIT, ELECTRICALLY ERASABLE, AND PROGRAMMABLE READ-ONLY MEMORY

Available format(s)

Hardcopy , PDF

Language(s)

English

Published date

01-01-1999

Publisher

British Standards Institution

Foreword
Introduction
1 Marking and Ordering information
2 Application related description
3 Specification of the function
4 Limiting values (absolute maximum rating system)
5 Operating conditions (within the specified operating temperature
range)
6 Electrical characteristics
7 Programming
8 Mechanical and environmental ratings, characteristics and data
9 Additional information
10 Screening (if required)
11 Quality assessment procedures
12 Structural similarity procedures
13 Test conditions and inspection requirements
14 Additional measurement methods
Reference Documents
Table 1 - Group A: Lot-by-lot
Table 2 - Group B: Lot-by-lot
Table 3 - Group C: Periodic
Table 4 - Group D

Committee	EPL/47
DevelopmentNote	Supersedes 91/30744 DC. (06/2005)
DocumentType	Standard
Pages	22
PublisherName	British Standards Institution
Status	Current
Supersedes	91/30744 DC : DRAFT SEP 1991

Standards	Relationship
IEC 60748-2-11:1999	Identical

IEC 60134:1961	Rating systems for electronic tubes and valves and analogous semiconductor devices
IEC 60749:1996+AMD1:2000+AMD2:2001 CSV	Semiconductor devices - Mechanical and climatic test methods