BS IEC 61747-1 : 1998 AMD 10788

Name: BS IEC 61747-1 : 1998 AMD 10788
Brand: BSI

Superseded

View Superseded by

LIQUID CRYSTAL AND SOLID-STATE DISPLAY DEVICES - GENERIC SPECIFICATION

Superseded date

15-06-2000

Published date

23-11-2012

Publisher

British Standards Institution

1 Scope
2 Normative references
3 Terminology
    3.1 Physical concepts
    3.2 General terms
    3.3 Terms related to ratings and characteristics
4 Technical aspects
    4.1 Order of precedence
    4.2 Terminology, units and symbols
    4.3 Preferred values of temperature, humidity and
          pressure
    4.4 Marking
          4.4.1 Device identification
          4.4.2 Device traceability
          4.4.3 Packing
    4.5 Categories of assessed quality
    4.6 Screening
    4.7 Handling
5 Quality assessment procedures
    5.1 Eligibility for qualification approval
          5.1.1 Primary stage of manufacture
    5.2 Commercially confidential information
    5.3 Formation of inspection lots
    5.4 Structurally similar devices
    5.5 Granting of qualification approval
    5.6 Quality conformance inspection
          5.6.1 Division into groups and subgroups
          5.6.2 Inspection requirements
          5.6.3 Supplementary procedure for reduced inspection
          5.6.4 Sampling requirements for small lots
          5.6.5 Certified records of released lots (CRRL)
          5.6.6 Delivery of devices subjected to destructive
                  or non-destructive tests
          5.6.7 Delayed deliveries
          5.6.8 Supplementary procedure for deliveries
    5.7 Statistical sampling procedures
          5.7.1 AQL sampling plans
          5.7.2 LTPD sampling plans
    5.8 Endurance tests
    5.9 Endurance tests where the failure rate is specified
          5.9.1 General
          5.9.2 Selection of samples
          5.9.3 Failure
          5.9.4 Endurance test time and sample size
          5.9.5 Procedure to be used if the number of
                  observed failures exceeds the acceptance
                  number
    5.10 Accelerated test procedures
    5.11 Capability approval
6 Test and measurement procedures
    6.1 Standard atmospheric conditions for electrical and
          optical measurements
    6.2 Physical examination
          6.2.1 Visual examination
          6.2.2 Dimensions
          6.2.3 Permanence of marking
    6.3 Electrical and optical measurements
          6.3.1 General conditions and precautions
    6.4 Environmental tests
Annexes
A (informative) Cross references index
B (informative) Examples of outline drawings of liquid crystal
   display cells
C (normative) Orientation of LCD modules
D (normative) Lot tolerance percentage defective (LTPD)
  sampling plans

Provides a generic specification for liquid crystal and solid-state display devices. Specifies general methods for quality assessment for use in the IECQ system and gives general rules for measuring procedures of electrical and optical characteristics, rules for climatic and mechanical tests and rules for endurance tests. BS AMD 10788 RENUMBERS THIS STANDARD

Committee	EPL/47
DevelopmentNote	Renumbered and superseded by BS EN 61747-1. Supersedes 93/203880 DC. (01/2006)
DocumentType	Standard
PublisherName	British Standards Institution
Status	Superseded
SupersededBy	BS EN 61747-1:2000
Supersedes	93/203880 DC : APR 93

Standards	Relationship
IEC 61747-1:1998+AMD1:2003 CSV	Identical

ISO 1101:2017	Geometrical product specifications (GPS) — Geometrical tolerancing — Tolerances of form, orientation, location and run-out
IEC 60747-5:1992	Semiconductor devices - Discrete devices and integrated circuits -Part 5: Optoelectronic devices
IEC 60191-2:2012 DB	Mechanical standardization of semiconductor devices - Part 2: Dimensions
IEC 60410:1973	Sampling plans and procedures for inspection by attributes
IEC 60747-1:2006+AMD1:2010 CSV	Semiconductor devices - Part 1: General
IEC 60191-3:1999	Mechanical standardization of semiconductor devices - Part 3: General rules for the preparation of outline drawings of integrated circuits