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BS IEC 62396-2:2017

BS IEC 62396-2:2017

Current

Current

The latest, up-to-date edition.

Process management for avionics. Atmospheric radiation effects Guidelines for single event effects testing for avionics systems

Available format(s)

Hardcopy , PDF

Language(s)

English

Published date

11-01-2018

Publisher

British Standards Institution

FOREWORD
INTRODUCTION
1 Scope
2 Normative references
3 Terms and definitions
4 Abbreviated terms
5 Obtaining SEE data
6 Availability of existing SEE data for avionics applications
7 Considerations for SEE testing
8 Converting test results to avionics SEE rates
Annex A (informative) - Sources of SEE data published before
        the year 2000
Bibliography

Pertains to provide guidance related to the testing of electronic components for purposes of measuring their susceptibility to single event effects (SEE) induced by neutrons generated by cosmic ray interactions in the Earths atmosphere (atmospheric neutrons).

This part of IEC 62396 aims to provide guidance related to the testing of electronic components for purposes of measuring their susceptibility to single event effects (SEE) induced by neutrons generated by cosmic ray interactions in the Earth’s atmosphere (atmospheric neutrons). Since the testing can be performed in a number of different ways, using different kinds of radiation sources, it also shows how the test data can be used to estimate the SEE rate of electronic components and boards due to atmospheric neutrons at aircraft altitudes.

Although developed for the avionics industry, this process can be applied by other industrial sectors.

Committee
GEL/107
DevelopmentNote
Supersedes DD IEC/TS 62396-2 & 11/30256756 DC. (08/2014)
DocumentType
Standard
Pages
46
PublisherName
British Standards Institution
Status
Current
Supersedes

Standards Relationship
IEC 62396-2:2017 Identical

IEC 60749-38:2008 Semiconductor devices - Mechanical and climatic test methods - Part 38: Soft error test method for semiconductor devices with memory
BIS IS/IEC 61558-2-6 : 1ED 2016 SEMICONDUCTOR DEVICES - MECHANICAL AND CLIMATIC TEST METHODS - PART 44: NEUTRON BEAM IRRADIATED SINGLE EVENT EFFECT (SEE) TEST METHOD FOR SEMICONDUCTOR DEVICES
IEC 62396-4:2013 Process management for avionics - Atmospheric radiation effects - Part 4: Design of high voltage aircraft electronics managing potential single event effects
IEC 62396-5:2014 Process management for avionics - Atmospheric radiation effects - Part 5: Assessment of thermal neutron fluxes and single event effects in avionics systems
IEC 62396-3:2013 Process management for avionics - Atmospheric radiation effects - Part 3: System design optimization to accommodate the single event effects (SEE) of atmospheric radiation
IEC 62396-1:2016 Process management for avionics - Atmospheric radiation effects - Part 1: Accommodation of atmospheric radiation effects via single event effects within avionics electronic equipment

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Hardcopy - English
PDF - English
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