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  • BS IEC 62525 : 2007

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    Published date:  23-11-2012

    Publisher:  British Standards Institution

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    Table of Contents - (Show below) - (Hide below)

    IEEE Introduction
    1 Overview
       1.1 Scope
       1.2 Purpose
    2 References
    3 Definitions, acronyms, and abbreviations
       3.1 Definitions
       3.2 Acronyms and abbreviations
    4 Structure of this standard
    5 STIL orientation and capabilities tutorial (informative)
       5.1 Hello Tester
       5.2 Basic LS245
       5.3 STIL timing expressions/"Spec" information
       5.4 Structural test (scan)
       5.5 Advanced scan
       5.6 IEEE Std 1149.1-1990 scan
       5.7 Multiple data elements per test cycle
       5.8 Pattern reuse/direct access test
       5.9 Event data/non-cyclized STIL information
    6 STIL syntax description
       6.1 Case sensitivity
       6.2 Whitespace
       6.3 Reserved words
       6.4 Reserved characters
       6.6 Token length
       6.7 Character strings
       6.8 User-defined name characteristics
       6.9 Domain names
       6.10 Signal and group name characteristics
       6.11 Timing name constructs
       6.12 Number characteristics
       6.13 Timing expressions and units (time_expr)
       6.14 Signal expressions (sigref_expr)
       6.15 WaveformChar characteristics
       6.16 STIL name spaces and name resolution
    7 Statement structure and organization of STIL information
       7.1 Top-level statements and required ordering
       7.2 Optional top-level statements
       7.3 STIL files
    8 STIL statement
       8.1 STIL syntax
       8.2 STIL example
    9 Header block
       9.1 Header block syntax
       9.2 Header example
    10 Include statement
       10.1 Include statement syntax
       10.2 Include example
       10.3 File path resolution with absolute path notation
       10.4 File path resolution with relative path notation
    11 UserKeywords statement
       11.1 UserKeywords statement syntax
       11.2 UserKeywords example
    12 UserFunctions statement
       12.1 UserFunctions statement syntax
       12.2 UserFunctions example
    13 Ann statement
       13.1 Annotations statement syntax
       13.2 Annotations example
    14 Signals block
       14.1 Signals block syntax
       14.2 Signals block example
    15 SignalGroups block
       15.1 SignalGroups block syntax
       15.2 SignalGroups block example
       15.3 Default attribute values
       15.4 Translation of based data into WaveformChar
    16 PatternExec block
       16.1 PatternExec block syntax
       16.2 PatternExec block example
    17 PatternBurst block
       17.1 PatternBurst block syntax
       17.2 PatternBurst block example
    18 Timing block and WaveformTable block
       18.1 Timing and WaveformTable syntax
       18.2 Waveform event definitions
       18.3 Timing and WaveformTable example
       18.4 Rules for timed event ordering and waveform creation
       18.5 Rules for waveform inheritance
    19 Spec and Selector blocks
       19.1 Spec and Selector block syntax
       19.2 Spec and Selector block example
    20 ScanStructures block
       20.1 ScanStructures block syntax
       20.2 ScanStructures block example
    21 STIL Pattern data
       21.1 Cyclized data
       21.2 Multiple-bit cyclized data
       21.3 Non-cyclized data
       21.4 Scan data
       21.5 Pattern labels
    22 STIL Pattern statements
       22.1 Vector (V) statement
       22.2 WaveformTable (W) statement
       22.3 Condition (C) statement
       22.4 Call statement
       22.5 Macro statement
       22.6 Loop statement
       22.7 MatchLoop statement
       22.8 Goto statement
       22.9 BreakPoint statements
       22.10 IDDQTestPoint statement
       22.11 Stop statement
       22.12 ScanChain statement
    23 Pattern block
       23.1 Pattern block syntax
       23.2 Pattern initialization
       23.3 Pattern examples
    24 Procedures and MacroDefs blocks
       24.1 Procedures block
       24.2 Procedures example
       24.3 MacroDefs block
       24.4 Scan testing
       24.5 Procedure and Macro Data substitution
    Annex A (informative) - Glossary
    Annex B (informative) - STIL data model
    Annex C (informative) - GNU GZIP reference
    Annex D (informative) - Binary STIL data format
    Annex E (informative) - LS245 design description
    Annex F (informative) - STIL FAQs and language design decisions
    Annex G (informative) - List of participants

    Abstract - (Show below) - (Hide below)

    Defines a test description language that: a) Facilitates the transfer of large volumes of digital test vector data from CAE environments to automated test equipment (ATE) environments; b) Specifies pattern, format, and timing information sufficient to define the application of digital test vectors to a device under test (DUT).

    General Product Information - (Show below) - (Hide below)

    Committee GEL/93
    Document Type Standard
    Publisher British Standards Institution
    Status Current

    Standards Referencing This Book - (Show below) - (Hide below)

    ISO 2955:1983 Information processing — Representation of SI and other units in systems with limited character sets
    ISO/IEC 9899:2011 Information technology Programming languages C
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