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BS IEC 62527:2007

Current
Current

The latest, up-to-date edition.

Standard for extensions to standard test interface language (STIL) for DC level specification
Published date

31-12-2007

IEEE Introduction
1 Overview
   1.1 Scope
   1.2 Purpose
2 References
3 Definitions, acronyms and abbreviations
   3.1 Definitions
   3.2 Acronyms and abbreviations
4 Structure of this standard
5 Extension to Clause 6, STIL syntax description
   5.1 Additional reserved words
   5.2 DC expressions and units (dc_expr)
   5.3 Additions to STIL name spaces and name
        resolutions (IEEE Std 1450-1999, 6.16)
6 Statement structure and organization of STIL information
   6.1 Top-level statements and required ordering
   6.2 Optional top-level statements
7 Extensions to Clause 8, STIL statement
   7.1 STIL syntax
   7.2 STIL example
8 Extensions to Clause 19, Spec and Selector blocks
9 Extensions to Clause 16, PatternExec block
   9.1 PatternExec block syntax
   9.2 PatternExec block example
   9.3 DCLevels and DCSets usage in PatterExec and
        Pattern blocks
10 DCLevels block
   10.1 DCLevels block syntax
   10.2 DCLevels block example
   10.3 Inherit DCLevels Processing
   10.4 Inherit DCLevels example
11 DCSets block
   11.1 DCSets block syntax
   11.2 DCSets statement example
12 DCSequence block
   12.1 DCSequence block syntax
   12.2 DCSequence example
13 Extensions to Clause 18, WaveformTable block
   13.1 Event definition in WaveformTable block
   13.2 Mapping of event integers to DCLevels statements
   13.3 DC levels switching example
14 Extension to Clause 22, STIL Patten statements
   14.1 DCLevles statements
   14.2 DCLevles statements example
Annex A (informative) - Dclevels and DCSets usage example
Annex B (informative) - Bibliography
Annex C (informative) - List of participants

Extends IEEE Std 1450-1999 (STIL) to support the definitions of DC levels.

STIL language constructs are defined to specify the DC conditions necessary to excute digital vectors on automated test equipment(ATE). STIL language extensions include structures for:(a) specifying the DC conditions for a device under test; specifying DC conditions either globally, by pattern burst, by pattern, or by vector;(c) specifying alternate DC levels;and (d) selecting DC levels and alternate levels within a period, much the same as timed format events.

Committee
EPL/501
DocumentType
Standard
PublisherName
British Standards Institution
Status
Current

Standards Relationship
IEC 62527:2007 Identical
IEEE 1450.2 : 2007 Identical

IEEE 1450 : 2007 STANDARD TEST INTERFACE LANGUAGE (STIL) FOR DIGITAL TEST VECTOR DATA

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