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BS IEC 62951-6:2019

Current
Current

The latest, up-to-date edition.

Semiconductor devices. Flexible and stretchable semiconductor devices Test method for sheet resistance of flexible conducting films
Available format(s)

Hardcopy , PDF

Language(s)

English

Published date

15-05-2019

IEC 62951-6:2019 specifies terms, as well as the test method and report of sheet resistance of the flexible conducting film under bending and folding tests. The measurement methods include the 2-point probe, 4-point probe and Montgomery method, which can be applied to in-situ and ex-situ measurement and the measurements of anisotropic sheet resistance.

Committee
EPL/47
DocumentType
Standard
ISBN
9780580972935
Pages
28
ProductNote
THIS STANDARD IDENTICAL TO IEC 62951-6
PublisherName
British Standards Institution
Status
Current

View more information
£186.00
Excluding VAT

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