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BS ISO 15932:2013

Current
Current

The latest, up-to-date edition.

Microbeam analysis. Analytical electron microscopy. Vocabulary
Available format(s)

Hardcopy , PDF

Language(s)

English

Published date

31-12-2013

Foreword
Introduction
0 Scope
1 Abbreviated terms
2 Definitions of terms used in the physical basis
  of AEM
3 Definitions of terms used in AEM instrumentation
4 Definitions of terms used in specimen preparation
  of AEM
5 Definitions of terms used in AEM image formation
  and processing
6 Definitions of terms used in AEM image
  interpretation and analysis
7 Definitions of terms used in the measurement and
  calibration of AEM image magnification
  and resolution
8 Definitions of terms used in electron diffraction
  in AEM
Bibliography

Describes terms used in the practice of AEM. It includes both general and specific concepts classified according to their hierarchy in a systematic order.

This International Standard defines terms used in the practice of AEM. It covers both general and specific concepts classified according to their hierarchy in a systematic order. This International Standard is applicable to all standardization documents relevant to the practice of AEM. In addition, some parts of this International Standard are applicable to those documents relevant to the practice of related fields (e.g. TEM, STEM, SEM, EPMA, EDX) for the definition of those terms common to them. NOTE See also the ISO online browsing platform (OBP): https://www.iso.org/obp/ui/

Committee
CII/9
DevelopmentNote
Supersedes 12/30245653 DC. (01/2014)
DocumentType
Standard
Pages
32
PublisherName
British Standards Institution
Status
Current
Supersedes

Standards Relationship
ISO 15932:2013 Identical

ISO 1087-1:2000 Terminology work Vocabulary Part 1: Theory and application
ISO 22493:2014 Microbeam analysis Scanning electron microscopy Vocabulary
ISO 23833:2013 Microbeam analysis — Electron probe microanalysis (EPMA) — Vocabulary
ISO 704:2009 Terminology work — Principles and methods

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