BS ISO 21222:2020
Current
Current
The latest, up-to-date edition.
Surface chemical analysis. Scanning probe microscopy. Procedure for the determination of elastic moduli for compliant materials using atomic force microscope and the two-point JKR method
Available format(s)
Hardcopy , PDF
Language(s)
English
Published date
07-02-2020
Publisher
This document describes a procedure for the determination of elastic modulus for compliant materials using atomic force microscope (AFM).
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