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BS ISO 21222:2020

Current

Current

The latest, up-to-date edition.

Surface chemical analysis. Scanning probe microscopy. Procedure for the determination of elastic moduli for compliant materials using atomic force microscope and the two-point JKR method

Available format(s)

Hardcopy , PDF

Language(s)

English

Published date

07-02-2020

This document describes a procedure for the determination of elastic modulus for compliant materials using atomic force microscope (AFM).

This document describes a procedure for the determination of elastic modulus for compliant materials using atomic force microscope (AFM). Force-distance curves on the surface of compliant materials are measured and the analysis uses a two-point method based on Johnson-Kendall-Roberts (JKR) theory. This document is applicable to compliant materials with elastic moduli ranging from 100 kPa to 1 GPa. The spatial resolution is dependent on the contact radius between the AFM probe and the surface and is typically approximately10-20nm.

Committee
CII/60
DocumentType
Standard
ISBN
9780580964299
Pages
26
PublisherName
British Standards Institution
Status
Current

Standards Relationship
ISO 21222:2020 Identical

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