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BS QC 400000:1990

Withdrawn
Withdrawn

A Withdrawn Standard is one, which is removed from sale, and its unique number can no longer be used. The Standard can be withdrawn and not replaced, or it can be withdrawn and replaced by a Standard with a different number.

Harmonized system of quality assessment for electronic components. Fixed resistors for use in electronic equipment: generic specification
Available format(s)

Hardcopy , PDF

Withdrawn date

01-04-2007

Language(s)

English

Published date

31-08-1990

National foreword
Committees responsible
Section One - Scope
1. Scope
Section Two - General
2. General
2.1 Related documents
2.2 Units, symbols and terminology
2.3 Preferred values
2.4 Marking
Section Three. Quality assessment procedures
3. Quality assessment procedures
3.1 Qualification Approval/Quality Assessment Systems
3.2 Primary Stage of Manufacture
3.3 Structurally Similar Components
3.4 Qualification Approval Procedures
3.5 Quality Conformance Inspection
3.6 Alternative test methods
3.7 Unchecked parameters
Section Four. Test and measurement procedures
4. Test and measurement procedures
4.1 General
4.2 Standard atmospheric conditions
4.3 Drying
4.4 Visual examination and check of dimensions
4.5 Resistance
4.6 Insulation resistance (insulated styles only)
4.7 Voltage proof
4.8 Variation of resistance with temperature
4.9 Reactance
4.10 Non-linear properties
4.11 Voltage coefficient
4.12 Noise
4.13 Overload
4.14 Temperature rise
4.15 Robustness of the resistor body
4.16 Robustness of terminations
4.17 Solderability
4.18 Resistance to soldering heat
4.19 Rapid change of temperature
4.20 Bump
4.21 Shock
4.22 Vibration
4.23 Climatic sequence
4.24 Damp heat, steady state
4.25 Endurance
4.26 Accidental overload test (for low power non-
      wirewound resistors only)
4.27 Single-pulse high-voltage overload test
4.28 Periodic pulse high-voltage overload test
4.29 Component solvent resistance
4.30 Solvent resistance of marking
4.31 Mounting (for chip resistors only)
4.32 Adhesion
4.33 Bond strength of the end face plating
Appendix
A. Interpretation of sampling plans and procedures as
      described in IEC Publication 410 for use within
      the IEC Quality Assessment System for Electronic
      Components
B. Rules for the preparation of detail specifications
      for capacitors and resistors for electronic
      equipment
C. Example of a test equipment for the periodic pulse
      high-voltage overload test

Describes fixed resistors for use in electronic equipment. Establishes standard terms, inspection procedures and methods of test for use in sectional and detail specifications for qualification approval and for quality assessment systems for electronic components.

Committee
W/-
DevelopmentNote
Supersedes 85/24369 DC and BS 9940-0(1983). (08/2005)
DocumentType
Standard
Pages
52
PublisherName
British Standards Institution
Status
Withdrawn
Supersedes

BS QC 400202:1992 Specification for harmonized system of quality assessment for electronic components. Fixed resistors for use in electronic equipment. Blank detail specification. Fixed power resistors. Assessment level F
BS QC 400102:1992 Specification for harmonized system of quality assessment for electronic components. Fixed resistors for use in electronic equipment. Blank detail specification. Fixed low-power non-wirewound resistors. Assessment level F
BS QC 400600:1990 Harmonized system of quality assessment for electronic components. Fixed resistors for use in electronic equipment. Sectional specification: fixed surface mounting (chip) resistors
BS QC 400203:1993 Specification for fixed resistors for use in electronic equipment. Blank detail specification. Fixed power resistors, heat-sink types. Assessment level H
BS QC 400302:1992 Specification for harmonized system of quality assessment for electronic components. Fixed resistors for use in electronic equipment. Blank detail specification. Fixed precision resistors. Assessment level F

BS 5692:1979 Method for measurement of the dimensions of a cylindrical electronic component having two axial terminations
BS 2011-2.1M:1984 Environmental testing. Tests Test M. Low air pressure
BS 2011-2.1B:1977 Environmental testing. Tests Tests B. Dry Heat
BS 4119:1967 Method of measurement of current noise generated in fixed resistors
BS 923-2:1980 Guide on high-voltage testing techniques Test procedures
BS 2488:1966 Schedule of preferred numbers for the resistance of resistors and the capacitance of capacitors for telecommunication equipment
IEC 60027-1:1992 Letters symbols to be used in electrical technology - Part 1: General
BS 2011-2.1N:1985 Environmental testing. Tests Test N. Change of temperature
BS 2045:1965 Preferred numbers
BS 2011-2.1Ca:1977 Environmental testing. Tests Test Ca. Damp heat, steady state
BS 4727(1971) : LATEST
BS 9000-3:1987 General requirements for a system for electronic components of assessed quality Specification for national implementation of IECQ basic rules and rules of procedure
BS 5555:1981 Specification for SI units and recommendations for the use of their multiples and of certain other units
BS 5694:1979 Method for measurement of non-linearity in resistors
BS 6001(1972) : AMD 5054 SAMPLING PROCEDURES FOR INSPECTION BY ATTRIBUTES - SPECIFICATION FOR SAMPLING PLANS INDEXED BY ACCEPTABLE QUALITY LEVEL (AQL) FOR LOT - BY - LOT INSPECTION
BS 2011-2.1T:1981 Environmental testing. Tests Test T. Soldering

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