Specification for harmonized system of quality assessment for electronic components. Semiconductor devices. Integrated circuits. Blank detail specification. Integrated circuit fusible-link programmable bipolar read-only memories

Available format(s)

Hardcopy , PDF

Language(s)

English

Published date

15-02-1992

Publisher

British Standards Institution

Committee	EPL/47
DevelopmentNote	Also numbered as IEC 60748-2-7 (08/2005)
DocumentType	Standard
Pages	20
PublisherName	British Standards Institution
Status	Current

IEC 60134:1961	Rating systems for electronic tubes and valves and analogous semiconductor devices
BS 3939-12:1985	Guide for graphical symbols for electrical power, telecommunications and electronics diagrams Binary logic elements
BS QC790100(1991) : 1991 AMD 10586	HARMONIZED SYSTEM OF QUALITY ASSESSMENT FOR ELECTRONIC COMPONENTS - SEMICONDUCTOR DEVICES - SECTIONAL SPECIFICATION FOR SEMICONDUCTOR INTEGRATED CIRCUITS EXCLUDING HYBRID CIRCUITS
BS 6493-3:1985	Semiconductor devices Mechanical and climatic test methods
BS QC 001002:1991	Rules of procedure of the IEC quality assessment system for electronic components (IECQ)
BS QC700000(1991) : 1991	HARMONIZED SYSTEM OF QUALITY ASSESSMENT FOR ELECTRIC COMPONENTS - GENERIC SPECIFICATION FOR DISCRETE DEVICES AND INTEGRATED CIRCUITS