SEMICONDUCTOR DEVICES - MECHANICAL AND CLIMATIC TEST METHODS - PART 1: GENERAL

Available format(s)

Hardcopy , PDF

Language(s)

English - Italian

Published date

01-01-2005

Publisher

Comitato Elettrotecnico Italiano

INTRODUCTION
1 Scope
2 Normative references
3 Terms, definitions and letter
  symbols
4 Standard atmospheric conditions
5 Electrical measurements
6 Use of electrically defective
  devices
Annex A (informative) - Cross-references
        index
Annex ZA (normative) - Normative
         references to international
         publications with their
         corresponding European
         publications

Defines to semiconductor devices (discrete devices and integrated circuits) and establishes provisions common to all the other parts of the series.

Committee	CT 309
DevelopmentNote	Classificazione CEI 47-40. (05/2005) Supersedes CEI EN 60749. (05/2008)
DocumentType	Standard
Pages	18
PublisherName	Comitato Elettrotecnico Italiano
Status	Current
Supersedes	CEI EN 60749 : 2000 AMD 2 2004

Standards	Relationship
IEC 60749-1:2002	Identical
EN 60749-1:2003	Identical

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CEI EN 60749-1 : 2005

SEMICONDUCTOR DEVICES - MECHANICAL AND CLIMATIC TEST METHODS - PART 1: GENERAL

Table of Contents

Abstract

General Product Information

International Equivalents

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