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CEI
CEI EN 60749-31 : 2004

CEI EN 60749-31 : 2004

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Current

The latest, up-to-date edition.

SEMICONDUCTOR DEVICES - MECHANICAL AND CLIMATIC TEST METHODS - PART 31: FLAMMABILITY OF PLASTIC-ENCAPSULATED DEVICES (INTERNALLY INDUCED)

Available format(s)

Hardcopy , PDF

Language(s)

English

Published date

01-01-2004

Publisher

Comitato Elettrotecnico Italiano

EWORD
INTRODUCTION
1 Scope and object
2 Normative references
3 Test procedure

Describes to the applicable to semiconductor devices (discrete devices and integrated circuits).

Committee
CT 309
DevelopmentNote
Classificazione CEI 47-34. (01/2005) Supersedes CEI EN 60749. (05/2008)
DocumentType
Standard
Pages
12
PublisherName
Comitato Elettrotecnico Italiano
Status
Current
Supersedes

Standards Relationship
IEC 60749-31:2002 Identical
EN 60749-31:2003 Identical

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PDF - English
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