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CEI EN 60749-6 : 2004

Current
Current

The latest, up-to-date edition.

DISPOSITIVI A SEMICONDUTTORE - METODI PER PROVE CLIMATICHE E MECCANICHE - PARTE 6: IMMAGAZZINAMENTO AD ALTA TEMPERATURA
Available format(s)

Hardcopy , PDF

Language(s)

English

Published date

01-01-2004

Publisher

Comitato Elettrotecnico Italiano

FOREWORD
1 Scope
2 Normative references
3 Terms and definitions
4 Test apparatus
5 Procedure
6 Summary
Bibliography

Defines the effect on all solid state electronic devices of storage at elevated temperature without electrical stress applied.

Committee
CT 309
DevelopmentNote
Classificazione CEI 47-17 (04/2004) Supersedes CEI EN 60749. (05/2008) 1ED 2004 Edition is valid until 07-04-2020. (12/2017)
DocumentType
Standard
Pages
12
PublisherName
Comitato Elettrotecnico Italiano
Status
Current
Supersedes

Standards Relationship
IEC 60749-6:2017 Identical
EN 60749-6:2017 Identical

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PDF - English
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