• There are no items in your cart
We noticed you’re not on the correct regional site. Switch to our AMERICAS site for the best experience.
Dismiss alert

DIN EN 15305 E : 2009

Current
Current

The latest, up-to-date edition.

NON-DESTRUCTIVE TESTING - TEST METHOD FOR RESIDUAL STRESS ANALYSIS BY X-RAY DIFFRACTION
Available format(s)

Hardcopy , PDF

Published date

01-01-2009

Foreword
Introduction
1 Scope
2 Normative references
3 Terms, definitions and symbols
   3.1 Terms and definitions
   3.2 Symbols and abbreviations
4 Principles
   4.1 General principles of the measurement
   4.2 Biaxial stress analysis
   4.3 Triaxial stress analysis
5 Specimen
   5.1 Material characteristics
   5.2 Preparation of specimen
6 Equipment
   6.1 General
   6.2 Choice of equipment
   6.3 Choice of radiation
   6.4 Choice of the detector
   6.5 Performance of the equipment
   6.6 Qualification and verification of the equipment
7 Experimental Method
   7.1 General
   7.2 Specimen positioning
   7.3 Diffraction conditions
   7.4 Data collection
8 Treatment of the data
   8.1 General
   8.2 Treatment of the diffraction data
   8.3 Stress calculation
   8.4 Critical assessment of the results
9 Report
10 Experimental determination of XECs
   10.1 Introduction
   10.2 Loading device
   10.3 Specimen
   10.4 Loading device calibration and specimen
        accommodation
   10.5 Diffractometer measurements
   10.6 Calculation of XECs
11 Reference specimens
   11.1 Introduction
   11.2 Stress-free reference specimen
   11.3 Stress-reference specimen
12 Limiting cases
   12.1 Introduction
   12.2 Presence of a subsurface stress gradient
   12.3 Surface stress gradient
   12.4 Surface roughness
   12.5 Non-flat surfaces
   12.6 Effects of specimen microstructure
   12.7 Broad diffraction lines
Annex A (informative) Schematic representation of the
        European XRPD Standardisation Project
Annex B (informative) Sources of Residual Stress
        B.1 General
        B.2 Mechanical processes
        B.3 Thermal processes
        B.4 Chemical processes
Annex C (normative) Determination of the stress
        state - General Procedure
        C.1 General
        C.2 Using the exact definition of the deformation
        C.3 Using an approximation of the definition
            of the deformation
Annex D (informative) Recent developments
        D.1 Stress measurement using two-dimensional
            diffraction data
        D.2 Depth resolved evaluation of near surface
            residual stress - The Scattering Vector Method
        D.3 Accuracy improvement through the use
            of equilibrium conditions for determination of
            stress profile
Annex E (informative) Details of treatment of
        the measured data
        E.1 Intensity correction on the scan
        E.2 Diffraction line position determination
        E.3 Correction on the diffraction line position
Annex F (informative) General description
        of acquisition methods
        F.1 Introduction
        F.2 Definitions
        F.3 Description of the various acquisition methods
        F.4 Choice of [phi] and [psi] angles
        F.5 The stereographic projection
Annex G (informative) Normal Stress Measurement
        Procedure and Dedicated Stress
        Measurement Procedure
        G.1 Introduction
        G.2 General
Bibliography
National Annex NA (informative) Bibliography

Defines the test method for the determination of macroscopic residual or applied stresses non-destructively by X-ray diffraction analysis in the near-surface region of a polycrystalline specimen or component.

DocumentType
Standard
Pages
90
PublisherName
German Institute for Standardisation (Deutsches Institut für Normung)
Status
Current

Standards Relationship
EN 15305:2008/AC:2009 Identical

ISO 5725-1:1994 Accuracy (trueness and precision) of measurement methods and results — Part 1: General principles and definitions
DIN ISO 5725-2:2002-12 Accuracy (trueness and precision) of measurement methods and results - Part 2: Basic method for the determination of repeatability and reproducibility of a standard measurement method (ISO 5725-2:1994 including Technical Corrigendum 1:2002)
ASTM E 915 : 2016 : REDLINE Standard Test Method for Verifying the Alignment of X-Ray Diffraction Instrumentation for Residual Stress Measurement
CEN ISO/TS 21432:2005/AC:2009 NON-DESTRUCTIVE TESTING - STANDARDS TEST METHOD FOR DETERMINING RESIDUAL STRESSES BY NEUTRON DIFFRACTION
ASTM E 1426 : 2014 : REDLINE Standard Test Method for Determining the X-Ray Elastic Constants for Use in the Measurement of Residual Stress Using X-Ray Diffraction Techniques
DIN ISO 5725-1:1997-11 ACCURACY (TRUENESS AND PRECISION) OF MEASUREMENT METHODS AND RESULTS - PART 1: GENERAL PRINCIPLES AND DEFINITIONS
ISO/TR 25107:2006 Non-destructive testing Guidelines for NDT training syllabuses
EN 13925-1:2003 Non-destructive testing - X-ray diffraction from polycrystalline and amorphous material - Part 1: General principles
ISO 5725-2:1994 Accuracy (trueness and precision) of measurement methods and results Part 2: Basic method for the determination of repeatability and reproducibility of a standard measurement method
CEN ISO/TR 25107:2006 Non-destructive testing - Guidelines for NDT training syllabuses (ISO/TR 25107:2006)
EN 13925-2:2003 Non-destructive testing - X-ray diffraction from polycrystalline and amorphous materials - Part 2: Procedures
EN 13925-3:2005 Non destructive testing - X ray diffraction from polycrystalline and amorphous materials - Part 3: Instruments
EN 1330-11:2007 Non-destructive testing - Terminology - Terms used in X-ray diffraction from polycrystalline and amorphous materials

View more information
£175.42
Excluding VAT

Access your standards online with a subscription

Features

  • Simple online access to standards, technical information and regulations.

  • Critical updates of standards and customisable alerts and notifications.

  • Multi-user online standards collection: secure, flexible and cost effective.