SEMICONDUCTOR DEVICES - MECHANICAL AND CLIMATIC TEST METHODS - PART 1: GENERAL

Available format(s)

Hardcopy , PDF

Language(s)

German

Published date

01-01-2003

Publisher

German Institute for Standardisation (Deutsches Institut für Normung)

INTRODUCTION
1 Scope
2 Normative references
3 Terms, definitions and letter symbols
4 Standard atmospheric conditions
5 Electrical measurements
6 Use of electrically defective devices
Annex ZA (normative) Normative references to international
publications with their corresponding European
publications

Applies to semiconductor devices (discrete devices and integrated circuits) and establishes provisions common to all the other parts of the series.

DevelopmentNote	Supersedes DIN EN 60749. (06/2005)
DocumentType	Standard
Pages	10
PublisherName	German Institute for Standardisation (Deutsches Institut für Normung)
Status	Current
Supersedes	DIN EN 60749:2002-09

Standards	Relationship
UNE-EN 60749-1:2004	Identical
BS EN 60749-1:2003	Identical
SN EN 60749-1 : 2003	Identical
NBN EN 60749-1 : 2004	Identical
NF EN 60749-1 : 2003	Identical
I.S. EN 60749-1:2003	Identical
EN 60749-1:2003	Identical
IEC 60749-1:2002	Identical