DIN EN 60749-27:2013-04
Current
Current
The latest, up-to-date edition.
SEMICONDUCTOR DEVICES - MECHANICAL AND CLIMATIC TEST METHODS - PART 27: ELECTROSTATIC DISCHARGE (ESD) SENSITIVITY TESTING - MACHINE MODEL (MM) (IEC 60749-27:2006+A1:2012)
Available format(s)
Hardcopy , PDF
Language(s)
German
Published date
01-01-2013
| DocumentType |
Standard
|
| Pages |
15
|
| PublisherName |
German Institute for Standardisation (Deutsches Institut für Normung)
|
| Status |
Current
|
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