SEMICONDUCTOR DEVICES - MECHANICAL AND CLIMATIC TEST METHODS - PART 31: FLAMMABILITY OF PLASTIC ENCAPSULATED DEVICES (INTERNALLY INDUCED)

Available format(s)

Hardcopy , PDF

Language(s)

German

Published date

01-01-2003

Publisher

German Institute for Standardisation (Deutsches Institut für Normung)

Foreword
INTRODUCTION
1 Scope and object
2 Normative references
3 Test procedure

Applies to semiconductor devices (discrete devices and integrated circuits). It determines whether the device ignites due to internal heating caused by excessive overloads.

DevelopmentNote	Supersedes DIN EN 60749 (06/2005)
DocumentType	Standard
Pages	5
PublisherName	German Institute for Standardisation (Deutsches Institut für Normung)
Status	Current
Supersedes	DIN EN 60749:2002-09

Standards	Relationship
NF EN 60749-31 : 2003	Identical
EN 60749-31:2003	Identical
SN EN 60749-31 : 2003	Identical
BS EN 60749-31:2003	Identical
I.S. EN 60749-31:2003	Identical
UNE-EN 60749-31:2004	Identical
NBN EN 60749-31 : 2004	Identical
IEC 60749-31:2002	Identical