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CEN
EN 1071-4:2006

EN 1071-4:2006

Current

Current

The latest, up-to-date edition.

Advanced technical ceramics - Methods of test for ceramic coatings - Part 4: Determination of chemical composition by electron probe microanalysis (EPMA)

Published date

15-02-2006

Publisher

Comite Europeen de Normalisation

Foreword
1 Scope
2 Normative references
3 Terms and definitions
  3.1 General
  3.2 Terms used in electron probe microanalysis
4 Principle
5 Apparatus and materials
  5.1 General
  5.2 Scanning electron microscope
  5.3 Electron probe microanalyser
  5.4 Energy dispersive spectrometer
  5.5 Wavelength dispersive spectrometer
6 Preparation of test piece
  6.1 General
  6.2 Surface roughness
  6.3 Surface conduction
7 Test procedure
  7.1 General
  7.2 Instrument
  7.3 Analysis of thin coatings
  7.4 Analysis of thick coatings
  7.5 Analysis of multilayer coatings
8 Accuracy and interferences
9 Test report
Bibliography

This European Standard describes methods for chemical analysis of ceramic coatings by means of electron probe microanalysis (EPMA) using a scanning electron microscope (SEM) or an electron probe microanalyser.The methods described are limited to the examination of single layer coatings when the analysis is carried out normal to the sample surface, but graded and multilayer coatings may also be analysed in cross-section if the thickness of the individual layers or gradations are greater than the maximum width of the volume of material within which characteristic or fluorescent X-rays are generated.NOTEThis method can also be used for the analysis of bulk materials.

Committee
CEN/TC 184
DevelopmentNote
Supersedes ENV 1071-4. (05/2006)
DocumentType
Standard
PublisherName
Comite Europeen de Normalisation
Status
Current
Supersedes

Standards Relationship
UNI EN 1071-4 : 2006 Identical
BS EN 1071-4:2006 Identical
NS EN 1071-4 : 1ED 2006 Identical
I.S. EN 1071-4:2006 Identical
PN EN 1071-4 : 2007 Identical
NF EN 1071-4 : 2006 Identical
NBN EN 1071-4 : 2006 Identical
UNE-EN 1071-4:2006 Identical
SN EN 1071-4 : 2006 Identical
NEN EN 1071-4 : 2006 Identical
DIN EN 1071-4:2006-05 Identical

DIN ISO 22309:2015-11 MICROBEAM ANALYSIS - QUANTITATIVE ANALYSIS USING ENERGY-DISPERSIVE SPECTROMETRY (EDS) FOR ELEMENTS WITH AN ATOMIC NUMBER OF 11 (NA) OR ABOVE (ISO 22309:2011)
PD CEN/TR 13233:2007 Advanced technical ceramics. Notations and symbols
CEN/TR 13233 : 2007 COR 2007 ADVANCED TECHNICAL CERAMICS - NOTATIONS AND SYMBOLS
BS ISO 22309:2011 Microbeam analysis. Quantitative analysis using energy-dispersive spectrometry (EDS) for elements with an atomic number of 11 (Na) or above
09/30185903 DC : 0 BS EN 14232 - ADVANCED TECHNICAL CERAMICS - TERMS, DEFINITIONS AND ABBREVIATIONS
DIN ISO 22309 E : 2015 MICROBEAM ANALYSIS - QUANTITATIVE ANALYSIS USING ENERGY-DISPERSIVE SPECTROMETRY (EDS) FOR ELEMENTS WITH AN ATOMIC NUMBER OF 11 (NA) OR ABOVE (ISO 22309:2011)
ISO 22309:2011 Microbeam analysis — Quantitative analysis using energy-dispersive spectrometry (EDS) for elements with an atomic number of 11 (Na) or above
UNI EN 14232 : 2009 ADVANCED TECHNICAL CERAMICS - TERMS, DEFINITIONS AND ABBREVIATIONS
PREN 14232 : DRAFT 2009 ADVANCED TECHNICAL CERAMICS - TERMS, DEFINITIONS AND ABBREVIATIONS
EN 14232:2009 Advanced technical ceramics - Terms, definitions and abbreviations
BS EN 14232:2009 Advanced technical ceramics. Terms, definitions and abbreviations
DD CEN/TR 13233 : 2007 ADVANCED TECHNICAL CERAMICS - NOTATIONS AND SYMBOLS
I.S. EN 14232:2009 ADVANCED TECHNICAL CERAMICS - TERMS, DEFINITIONS AND ABBREVIATIONS
S.R. CEN TR 13233:2007 ADVANCED TECHNICAL CERAMICS - NOTATIONS AND SYMBOLS

ISO/IEC 17025:2005 General requirements for the competence of testing and calibration laboratories
EN 623-4:2004 Advanced technical ceramics - Monolithic ceramics - General and textural properties - Part 4: Determination of surface roughness
ISO 14594:2014 Microbeam analysis Electron probe microanalysis Guidelines for the determination of experimental parameters for wavelength dispersive spectroscopy
ISO 15632:2012 Microbeam analysis Selected instrumental performance parameters for the specification and checking of energy-dispersive X-ray spectrometers for use in electron probe microanalysis

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