EN 13925-3:2005

Foreword
Introduction
1 Scope
2 Normative references
3 Terms and definitions
4 Description of equipment
   4.1 General
   4.2 X-ray sources
        4.2.1 General
        4.2.2 Conventional X-ray sources (sealed tubes and
               rotating anode sources)
        4.2.3 Synchrotron radiation sources
   4.3 Incident and diffracted X-ray beam optics
        4.3.1 General
        4.3.2 Monochromators
        4.3.3 Beam dimensions and geometry
   4.4 Detectors
        4.4.1 Types of detector
        4.4.2 Spatial resolution of detectors
        4.4.3 Energy resolution of detectors
   4.5 Goniometers
        4.5.1 General
        4.5.2 Specimen positioning
   4.6 Specimen stage
   4.7 Data collection system
5 Characterisation of equipment components
6 Equipment alignment and calibration
   6.1 General
   6.2 Alignment
   6.3 Calibration
7 Performance testing and monitoring
Annex A (informative) Relationship between the XRPD standards
Annex B (informative) Alignment of Bragg-Brentano diffractometers
Annex C (informative) Procedures for instrument performance
        characterisation
 C.1 General
 C.2 Position, intensity and breadth of a limited number of
      diffraction lines
 C.3 Angular Deviation Curve
 C.4 Line breadth
 C.5 Intensity diagrams
 C.6 Shape Analysis Curve
 C.7 Lattice parameters
 C.8 The use of the Fundamental Parameter Approach
 C.9 Whole pattern fitting
Annex D (informative) Sample report forms for characterisation of
        instruments
Bibliography