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EN 15991:2015

Current
Current

The latest, up-to-date edition.

Testing of ceramic and basic materials - Direct determination of mass fractions of impurities in powders and granules of silicon carbide by inductively coupled plasma optical emission spectrometry (ICP OES) with electrothermal vaporisation (ETV)
Published date

25-11-2015

European foreword
1 Scope
2 Principle
3 Spectrometry
4 Apparatus
5 Reagents and auxiliary material
6 Sampling and sample preparation
7 Calibration
8 Procedure
9 Wavelength and working range
10 Calculation of the results and evaluation
11 Reporting of results
12 Precision
13 Test report
Annex A (informative) - Results of interlaboratory study
Annex B (informative) - Wavelength and working range
Annex C (informative) - Possible interferences and their
        elimination
Annex D (informative) - Information regarding the evaluation
        of the uncertainty of the mean value
Annex E (informative) - Commercial certified reference
        materials
Annex F (informative) - Information regarding the validation
        of an analytical method based on liquid standards in
        the example of SiC and graphite
Bibliography

This European Standard defines a method for the determination of the trace element concentrations of Al, Ca, Cr, Cu, Fe, Mg, Ni, Ti, V and Zr in powdered and granular silicon carbide.Dependent on element, wavelength, plasma conditions and weight, this test method is applicable for mass contents of the above trace contaminations from about 0,1 mg/kg to about 1 000 mg/kg, after evaluation also from 0,001 mg/kg to about 5 000 mg/kg.NOTE 1Generally for optical emission spectrometry using inductively coupled plasma (ICP OES) and electrothermal vaporization (ETV) there is a linear working range of up to four orders of magnitude. This range can be expanded for the respective elements by variation of the weight or by choosing lines with different sensitivity.After adequate verification, the standard is also applicable to further metallic elements (excepting Rb and Cs) and some non-metallic contaminations (like P and S) and other allied non-metallic powdered or granular materials like carbides, nitrides, graphite, soot, coke, coal, and some other oxidic materials (see [1], [4], [5], [6], [7], [8], [9] and [10]).NOTE 2There is positive experience with materials like, for example, graphite, B4C, Si3N4, BN and several metal oxides as well as with the determination of P and S in some of these materials.

Committee
CEN/TC 187
DevelopmentNote
Supersedes PREN 15991. (12/2015)
DocumentType
Standard
PublisherName
Comite Europeen de Normalisation
Status
Current
Supersedes

Standards Relationship
UNI EN 15991:2016 Identical
UNI EN 15991 : 2011 Identical
BS EN 15991:2015 Identical
NF EN 15991 : 2016 Identical
SN EN 15991 : 2016 Identical
DIN EN 15991:2016-02 Identical
PN EN 15991 : 2016 Identical
NBN EN 15991 : 2015 Identical
NS EN 15991 : 2015 Identical
NEN EN 15991 : 2015 Identical
I.S. EN 15991:2015 Identical
UNE-EN 15991:2015 Identical

UNI EN ISO 1927-3 : 2013 MONOLITHIC (UNSHAPED) REFRACTORY PRODUCTS - PART 3: CHARACTERIZATION AS RECEIVED
BS EN ISO 1927-3:2012 Monolithic (unshaped) refractory products Characterization as received
I.S. EN ISO 1927-3:2012 MONOLITHIC (UNSHAPED) REFRACTORY PRODUCTS - PART 3: CHARACTERIZATION AS RECEIVED (ISO 1927-3:2012)
DIN EN ISO 1927-3:2013-03 MONOLITHIC (UNSHAPED) REFRACTORY MATERIALS - PART 3: CHARACTERIZATION AS RECEIVED (ISO 1927-3:2012)
EN ISO 1927-3:2012 Monolithic (unshaped) refractory products - Part 3: Characterization as received (ISO 1927-3:2012)
17/30327875 DC : DRAFT JAN 2017 BS ISO 16169 - PREPARATION OF SILICON CARBIDE AND SIMILAR MATERIALS FOR ANALYSIS BY ISO 12677 X-RAY FLUORESCENCE (XRF) - FUSED CAST-BEAD METHOD
ISO 1927-3:2012 Monolithic (unshaped) refractory products — Part 3: Characterization as received

ISO 5022:1979 Shaped refractory products Sampling and acceptance testing
EN ISO 21068-1:2008 Chemical analysis of silicon-carbide-containing raw materials and refractory products - Part 1: General information and sample preparation (ISO 21068-1:2008)
ISO 5725-4:1994 Accuracy (trueness and precision) of measurement methods and results Part 4: Basic methods for the determination of the trueness of a standard measurement method
ISO 21068-1:2008 Chemical analysis of silicon-carbide-containing raw materials and refractory products Part 1: General information and sample preparation
ISO 5725-2:1994 Accuracy (trueness and precision) of measurement methods and results Part 2: Basic method for the determination of repeatability and reproducibility of a standard measurement method
ISO 8656-1:1988 Refractory products Sampling of raw materials and unshaped products Part 1: Sampling scheme
ISO/IEC Guide 98-3:2008 Uncertainty of measurement — Part 3: Guide to the expression of uncertainty in measurement (GUM:1995)

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