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EN 196000 : 92 AMD 1 2001

Superseded

Superseded

A superseded Standard is one, which is fully replaced by another Standard, which is a new edition of the same Standard.

View Superseded by
superseded

A superseded Standard is one, which is fully replaced by another Standard, which is a new edition of the same Standard.

HARMONIZED SYSTEM OF QUALITY ASSESSMENT FOR ELECTRONIC COMPONENTS - GENERIC SPECIFICATION: ELECTROMECHANICAL SWITCHES

Superseded date

01-09-2009

Published date

12-01-2013

Cooperating organizations
National foreword
Foreword
Preface
Section one - Scope
1.1 Scope
1.2 Switch classes included
1.3 Switch classes excluded
Section two - General
2.1 Normative references
2.2 Units, symbols and terminology
2.3 Standard and preferred values
2.4 Marking
2.5 Safety requirements
Section three - Quality assessment procedure
3.1 Primary stage of manufacture
3.2 Structural similarity
3.3 Qualification approval procedure
3.4 Quality conformance inspection
3.5 Certified test records
3.6 Delayed delivery
3.7 Re-submission of rejected lots
3.8 Alternative test methods
3.9 Release for delivery before the completion of
        group B tests
3.10 Capability approval
3.11 Rework
Section four - Test and measurement procedures
4.1 Standard conditions for testing
4.2 Optional reduction of testing
4.3 Individual test methods
4.3.1 General examination
4.3.2 Electrical continuity and contact resistance
4.3.3 Insulation
4.3.4 Voltage stress
4.3.5 Current carrying capacity
4.3.6 Dynamic stress
4.3.7 Impact stress
4.3.8 Mechanical strength
4.3.9 Endurance
4.3.10 Overload
4.3.11 Climatic
4.3.12 Soldering
4.3.13 Mechanical operating characteristics
4.3.14 Sealing
4.3.15 Chemical resistance
4.3.16 Fire hazard
4.3.17 Capacitance
4.3.18 Illumination
4.3.19 Temperature response
Annex
A Test schedules for quality conformance
        inspection and qualification approval
National annex NA (informative) Committees responsible
National annex NB (informative) Cross-references

Relates to electromechanical switches meant primarily for use in telecommunications equipment and in electronic equipment employing techniques. Limited to switches with a maximum 500 v (d.c. or a.c. r.m.s) rated voltage and a maximum 25 A rated carrying current. Specifies the definitions, terms, test methods and other material necessary to prepare detail specifications for those components in the CECC System.

Committee
SR 23J
DocumentType
Standard
PublisherName
European Committee for Standards - Electrical
Status
Superseded
SupersededBy

BS EN 196103:2000 Blank detail specification: Rotary switches. Assessment level Y
BS EN 196403:2000 Harmonized systems of quality assessment for electronic components. Blank detail specification: push button switches. Assessment level Y
CECC 96600 : 1994 SECTIONAL SPECIFICATION (SLIDE SWITCHES)
BS CECC 96601:2002 Blank detail specification. Slide switches
CECC 96701 : 2002 BLANK DETAIL SPECIFICATION: DUAL-IN-LINE SWITCHES
BS CECC 96701:2002 Blank detail specification. Dual-in-line switches
I.S. CECC 96600:1994 SLIDE SWITCHES (SECTIONAL SPECIFICATION)

IEC 60068-2-5:2010 Environmental testing - Part 2-5: Tests - Test Sa: Simulated solar radiation at ground level and guidance for solar radiation testing
CECC 00109 : 1974 CECC RULES OF PROCEDURE: RP 9: CERTIFIED TESTS RECORDS
IEC 60512-8:1993 Electromechanical components for electronic equipment; basic testing procedures and measuring methods - Part 8: Connector tests (mechanical) and mechanical tests on contacts and terminations
IEC 60068-1:2013 Environmental testing - Part 1: General and guidance
IEC 60695-2-1:1991 Fire hazard testing - Part 2: Test methods - Section 1: Glow-wire test and guidance
IEC 61020-1:2009 Electromechanical switches for use in electrical and electronic equipment - Part 1: Generic specification
IEC 60512-6:1984 Electromechanical components for electronic equipment; basic testing procedures and measuring methods. Part 6: Climatic tests and soldering tests
IEC 60068-2-27:2008 Environmental testing - Part 2-27: Tests - Test Ea and guidance: Shock
IEC 60341-1:1970 Push-button switches - Part 1: General requirements and measuring methods
IEC 60068-2-21:2006 Environmental testing - Part 2-21: Tests - Test U: Robustness of terminations and integral mounting devices
IEC 60068-2-13:1983 Basic environmental testing procedures - Part 2-13: Tests - Test M: Low air pressure
IEC 60512-7:1993 Electromechanical components for electronic equipment; basic testing procedures and measuring methods - Part 7: Mechanical operating tests and sealing tests
CECC 00114 : 93 AMD 1 QUALITY ASSESSMENT PROCEDURES - APPROVAL OF MANUFACTURERS AND OTHER ORGANIZATIONS
IEC 60410:1973 Sampling plans and procedures for inspection by attributes
IEC 60068-2-17:1994 Basic environmental testing procedures - Part 2-17: Tests - Test Q: Sealing
IEC 60512-4:1976 Electromechanical components for electronic equipment; basic testing procedures and measuring methods. Part 4: Dynamic stress tests
CECC 00111 : 80 AMD 3 CECC RULES OF PROCEDURE: RP 11: SPECIFICATIONS AND THEIR HARMONIZATION - COMPONENTS FOR GENERAL AND PROFESSIONAL USAGE - COMPONENTS OF ENHANCED ASSESSMENT OF QUALITY
IEC 60512-9:1992 Electromechanical components for electronic equipment; basic testing procedures and measuring methods - Part 9: Miscellaneous tests
CECC 00009 : 1980 BASIC SPECIFICATION: BASIC TESTING PROCEDURES AND MEASURING METHODS FOR ELECTROMECHANICAL COMPONENTS
IEC 60068-2-29:1987 Environmental testing. Part 2: Tests. Test Eb and guidance: Bump
IEC 60512-5:1992 Electromechanical components for electronic equipment; basic testing procedures and measuring methods - Part 5: Impact tests (free components), static load tests (fixed components), endurance tests and overload tests
IEC 60512-1:2001 Connectors for electronic equipment - Tests and measurements - Part 1: General
CECC 00007 : 1978 BASIC SPECIFICATION: SAMPLING PLANS AND PROCEDURES FOR INSPECTION BY ATTRIBUTES
IEC 60050-581:2008 International Electrotechnical Vocabulary (IEV) - Part 581: Electromechanical components for electronic equipment
IEC 60512-3:1976 Electromechanical components for electronic equipment; basic testing procedures and measuring methods. Part 3: Current-carrying capacity tests

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