EN 60749-42:2014
Current
Current
The latest, up-to-date edition.
Semiconductor devices - Mechanical and climatic test methods - Part 42: Temperature and humidity storage
Published date
03-10-2014
FOREWORD
1 Scope
2 Normative references
3 Test equipment
4 Procedure
5 Failure criteria
6 Information to be given in applicable
procurement document
Annex ZA (normative) - Normative references to international
Publications with their corresponding European
publications
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