EN 61751:1998

Withdrawn

Laser modules used for telecommunication - Reliability assessment

Withdrawn date

23-07-2013

Published date

10-04-1998

Publisher

European Committee for Standards - Electrical

FOREWORD
INTRODUCTION
1 Scope
2 Normative references
3 Terms and definitions
4 Laser reliability and quality assurance procedure
  4.1 Demonstration of product quality
  4.2 Testing responsibilities
  4.3 Quality Improvement Programmes (QIPs)
5 Tests
  5.1 Structural similarity
  5.2 Burn-in and screening (when applicable in the DS)
6 Activities
  6.1 Analysis of reliability results
  6.2 Technical visits to LMMs
  6.3 Design/process changes
  6.4 Deliveries
  6.5 Supplier documentation
Annex A (normative) Laser diode and laser module failure mechanisms
Annex B (informative) Guide
Annex ZA (normative) Normative references to international
         publications with their corresponding European
         publications

The aim of this standard is: - to establish a standard method of assessing the reliability of laser modules in order to minimize risks and to promote product development and reliability; - to establish means by which the distribution of failures with time can be determined. This should enable the determination of equipment failure rates for specified end of life criteria.

Committee	CLC/SR 86
DocumentType	Standard
PublisherName	European Committee for Standards - Electrical
Status	Withdrawn

Standards	Relationship
NEN EN IEC 61751 : 1998	Identical
SN EN 61751 : 1998	Identical
PN EN 61751 : 2002	Identical
NF EN 61751 : 1998	Identical
IEC 61751:1998	Identical
NBN EN 61751 : 1998	Identical
I.S. EN 61751:1999	Identical
UNE-EN 61751:1998	Identical
BS EN 61751:1998	Identical
CEI EN 61751 : 1999	Identical
DIN EN 61751:1998-11	Identical

MIL-STD-883 Revision K:2016	TEST METHOD STANDARD - MICROCIRCUITS
EN 60068-2-1:2007	Environmental testing - Part 2-1: Tests - Test A: Cold
HD 323.2.14 : 200S2	BASIC ENVIRONMENTAL TESTING PROCEDURES - TESTS - TEST N: OF TEMPERATURE
IEC 60747-12-2:1995	Semiconductor devices - Part 12: Optoelectronic devices - Section 2: Blank detail specification for laser diode modules with pigtail for fibre optic systems and sub-systems
IEC 60747-1:2006+AMD1:2010 CSV	Semiconductor devices - Part 1: General
IEC 60749:1996+AMD1:2000+AMD2:2001 CSV	Semiconductor devices - Mechanical and climatic test methods
ISO 9000:2015	Quality management systems — Fundamentals and vocabulary
IEC 60068-2-1:2007	Environmental testing - Part 2-1: Tests - Test A: Cold
IEC 60068-2-14:2009	Environmental testing - Part 2-14: Tests - Test N: Change of temperature
EN ISO 9000:2015	Quality management systems - Fundamentals and vocabulary (ISO 9000:2015)