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EN 62572-3:2016

Current
Current

The latest, up-to-date edition.

Fibre optic active components and devices - Reliability standards - Part 3: Laser modules used for telecommunication
Published date

03-06-2016

Publisher

European Committee for Standards - Electrical

FOREWORD
INTRODUCTION
1 Scope
2 Normative references
3 Terms, definitions, symbols and
  abbreviations
4 Laser reliability and quality assurance
  procedure
5 Tests
6 Activities
Annex A (informative) - Guidance on testing
        in Table 1 and Table 2
Bibliography
Annex ZA (normative) - Normative references to
         international publications with their
         corresponding European publications

IEC 62572-3:2014 deals with reliability assessment of laser modules used for telecommunication.

DocumentType
Standard
PublisherName
European Committee for Standards - Electrical
Status
Current
Supersedes

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BS EN 61291-2:2016 Optical amplifiers Single channel applications. Performance specification template
I.S. EN 61291-2:2016 OPTICAL AMPLIFIERS - PART 2: SINGLE CHANNEL APPLICATIONS - PERFORMANCE SPECIFICATION TEMPLATE
EN 62149-3:2014 Fibre optic active components and devices - Performance standards - Part 3: Modulator-integrated laser diode transmitters for 2,5-Gbit/s to 40-Gbit/s fibre optic transmission systems
BS EN 62149-3:2014 Fibre optic active components and devices. Performance standards Modulator-integrated laser diode transmitters for 2,5-Gbit/s to 40-Gbit/s fibre optic transmission systems

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MIL-STD-883 Revision K:2016 TEST METHOD STANDARD - MICROCIRCUITS
IEC 60749-25:2003 Semiconductor devices - Mechanical and climatic test methods - Part 25: Temperature cycling
EN 60068-2-1:2007 Environmental testing - Part 2-1: Tests - Test A: Cold
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IEC 60749-26:2013 Semiconductor devices - Mechanical and climatic test methods - Part 26: Electrostatic discharge (ESD) sensitivity testing - Human body model (HBM)
EN 60749-10:2002 Semiconductor devices - Mechanical and climatic test methods - Part 10: Mechanical shock
IEC 60747-1:2006+AMD1:2010 CSV Semiconductor devices - Part 1: General
EN 60749-8:2003 Semiconductor devices - Mechanical and climatic test methods - Part 8: Sealing
IEC 60749-6:2017 Semiconductor devices - Mechanical and climatic test methods - Part 6: Storage at high temperature
EN 60749-6:2017 Semiconductor devices - Mechanical and climatic test methods - Part 6: Storage at high temperature
EN 60749-26:2014 Semiconductor devices - Mechanical and climatic test methods - Part 26: Electrostatic discharge (ESD) sensitivity testing - Human body model (HBM)
IEC 60068-2-1:2007 Environmental testing - Part 2-1: Tests - Test A: Cold
IEC 60749-10:2002 Semiconductor devices - Mechanical and climatic test methods - Part 10: Mechanical shock
IEC TR 62572-2:2008 Fibre optic active components and devices - Reliability standards - Part 2: Laser module degradation
EN 60749-25:2003 Semiconductor devices - Mechanical and climatic test methods - Part 25: Temperature cycling
IEC 60068-2-14:2009 Environmental testing - Part 2-14: Tests - Test N: Change of temperature
EN 60068-2-14:2009 Environmental testing - Part 2-14: Tests - Test N: Change of temperature
IEC 60749-12:2002 Semiconductor devices - Mechanical and climatic test methods - Part 12: Vibration, variable frequency
EN 60749-12:2002 Semiconductor devices - Mechanical and climatic test methods - Part 12: Vibration, variable frequency

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