Semiconductor devices - Mechanical and climatic test methods - Part 12: Vibration, variable frequency

Published date

09-03-2018

Publisher

European Committee for Standards - Electrical

FOREWORD
1 Scope
2 Normative references
3 Terms and definitions
4 Test apparatus
5 Test method
6 Examination and test measurements
7 Failure criteria
8 Summary
Bibliography

IEC60749-12:2017 describes a test to determine the effect of variable frequency vibration, within the specified frequency range, on internal structural elements. This is a destructive test. It is normally applicable to cavity-type packagesThis second edition cancels and replaces the first edition published in 2002. This edition constitutes a technical revision.This edition includes the following significant technical changes with respect to the previous edition:a) alignment with MIL-STD-883J Method 2007, Vibration, variable frequency.

Committee	CLC/SR 47
DevelopmentNote	Supersedes EN 60749-12. (03/2018)
DocumentType	Standard
PublisherName	European Committee for Standards - Electrical
Status	Current
Supersedes	EN 60749-12:2002

Standards	Relationship
CEI EN IEC 60749-12:2018	Identical
UNE-EN IEC 60749-12:2018	Identical
IEC 60749-12:2002	Identical
BS EN IEC 60749-12:2018	Identical
PN-EN IEC 60749-12:2018	Identical

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EN IEC 60749-12:2018

Semiconductor devices - Mechanical and climatic test methods - Part 12: Vibration, variable frequency

Table of Contents

Abstract

General Product Information

International Equivalents

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