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EN IEC 60749-17:2019

Current
Current

The latest, up-to-date edition.

Semiconductor devices - Mechanical and climatic test methods - Part 17: Neutron irradiation
Published date

10-05-2019

The neutron irradiation test is performed to determine the susceptibility of semiconductor devices to non-ionizing energy loss (NIEL) degradation. The test described herein is applicable to integrated circuits and discrete semiconductor devices and is intended for military- and aerospace-related applications. It is a destructive test.The objectives of the test are as follows:a) to detect and measure the degradation of critical semiconductor device parameters as a function of neutron fluence, andb) to determine if specified semiconductor device parameters are within specified limits after exposure to a specified level of neutron fluence (see Clause 6).

Committee
CLC/SR 47
DocumentType
Standard
PublisherName
European Committee for Standards - Electrical
Status
Current
Supersedes

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