MIL G 23081 : C
|
GYROSCOPE INDICATOR SYSTEM VERTICAL. |
ANSI INCITS 200 : 1992
|
INFORMATION SYSTEMS - UNRECORDED OPTICAL MEDIA UNIT FOR DIGITAL INFORMATION INTERCHANGE - 356 MM WORM OPTICAL DISK CARTRIDGE - PARTS 1 AND 2 |
MIL A 83577 : B
|
ASSEMBLIES, MOVING MECHANICAL, FOR SPACE AND LAUNCH VEHICLES, GENERAL SPECIFICATION FOR |
MIL HDBK 337 : 0
|
ADHESIVE BONDED AEROSPACE STRUCTURE REPAIR |
MIL STD 1330 : D
|
STANDARD PRACTICE FOR PRECISION CLEANING AND TESTING OF SHIPBOARD OXYGEN, HELIUM, HELIUM-OXYGEN, NITROGEN AND HYDROGEN SYSTEMS |
MIL H 38534 : B (1)
|
HYBRID MICROCIRCUITS, GENERAL SPECIFICATION FOR |
MIL P 197 : H
|
PACKAGING OF BEARINGS, ANTIFRICTION, ASSOCIATED PARTS AND SUBASSEMBLIES |
MIL H 26385 : E
|
HOSE, OXYGEN AND PRESSURIZATION, OZONE RESISTANT |
MIL STD 1246 : C
|
PRODUCT CLEANLINESS LEVELS AND CONTAMINATION CONTROL PROGRAM |
MIL H 26626 : D
|
HOSE ASSEMBLY, TETRAFLUOROETHYLENE, OXYGEN |
BS EN 62258-1:2010
|
SEMICONDUCTOR DIE PRODUCTS - PART 1: PROCUREMENT AND USE |
01/206130 DC : DRAFT AUG 2001
|
IEC 62258 - SEMICONDUCTOR DIE PRODUCTS - MINIMUM REQUIREMENTS FOR PROCUREMENT AND USE - PART 1: GENERAL REQUIREMENTS - MECHANICAL, MATERIAL AND CONNECTIVITY |
ASTM F 979 : 1986 : R1998 : EDT 1
|
Standard Test Method for Hermeticity of Hybrid Microcircuit Packages Prior to Lidding |
ANSI INCITS 199 : 1991 : R2007
|
INFORMATION SYSTEMS - 356 MM OPTICAL DISK CARTRIDGE (WRITE-ONCE) - TEST METHODS FOR MEDIA CHARACTERISTICS |
ASTM E 2311 : 2004 : R2016
|
Standard Practice for QCM Measurement of Spacecraft Molecular Contamination in Space |
MIL M 9950 : A NOTICE 1
|
MISSILE COMPONENTS, LIQUID OXYGEN, LIQUID NITROGEN, GASEOUS OXYGEN, GASEOUS NITROGEN, INSTRUMENT AIR, HELIUM AND FUEL HANDLING SYSTEMS, CLEANING AND PACKAGING FOR DELIVERY |
MIL T 24747 : 0
|
TECHNICAL REPAIR STANDARDS (TRS) MANUAL; PREPARATION OF |
MIL STD 206 : B
|
FRICTION TORQUE TESTING FOR INSTRUMENT BALL BEARINGS PARTS 1 AND 2 |
I.S. EN 62258-1:2010
|
SEMICONDUCTOR DIE PRODUCTS - PART 1: PROCUREMENT AND USE |
ANSI INCITS 213 : 1994
|
INFORMATION TECHNOLOGY - 90-MM (3.54-IN) OPTICAL DISK CARTRIDGE REWRITABLE AND READ ONLY USING DISCRETE BLOCK FORMAT (DBF) METHOD FOR DIGITAL INFORMATION INTERCHANGE |
ASTM E 1549/E1549M : 2013
|
Standard Specification for ESD Controlled Garments Required in Cleanrooms and Controlled Environments for Spacecraft for Non-Hazardous and Hazardous Operations |
ASTM E 2311 : 2004 : R2009
|
Standard Practice for QCM Measurement of Spacecraft Molecular Contamination in Space |
ASTM F 1394 : 1992 : R2005
|
Standard Test Method for Determination of Particle Contribution from Gas Distribution System Valves |
ASTM E 2088 : 2006
|
Standard Practice for Selecting, Preparing, Exposing, and Analyzing Witness Surfaces for Measuring Particle Deposition in Cleanrooms and Associated Controlled Environments |
ASTM E 2217 : 2012 : REDLINE
|
Standard Practice for Design and Construction of Aerospace Cleanrooms and Contamination Controlled Areas |
ASTM F 612 : 1988
|
Practice for Cleaning Surfaces of Polished Silicon Slices (Withdrawn 1993) |
ASTM F 584 : 2006 : EDT 1
|
Standard Practice for Visual Inspection of Semiconductor Lead-Bonding Wire (Withdrawn 2015) |
ASTM E 2088 : 2006 : R2011
|
Standard Practice for Selecting, Preparing, Exposing, and Analyzing Witness Surfaces for Measuring Particle Deposition in Cleanrooms and Associated Controlled Environments |
ASTM F 584 : 2006
|
Standard Practice for Visual Inspection of Semiconductor Lead-Bonding Wire |
ASTM F 816 : 1983 : R2003
|
Standard Test Method for Combined Fine and Gross Leaks for Large Hybrid Microcircuit Packages (Withdrawn 2009) |
BS EN 13091:2000 (published 2000-03)
|
Biotechnology. Performance criteria for filter elements and filtration assemblies |
DIN EN 14736:2004-09
|
SPACE PRODUCT ASSURANCE - QUALITY ASSURANCE FOR TEST CENTRES |
EN 62258-1:2010
|
Semiconductor die products - Part 1: Procurement and use |
ASTM F 1708 : 2002
|
Standard Practice for Evaluation of Granular Polysilicon by Meter-Zoner Spectroscopies (Withdrawn 2003) |
MIL STD 976 : B
|
CERTIFICATION REQUIREMENTS FOR JAN MICROCIRCUITS |
ASTM E 2311 : 2004
|
Standard Practice for QCM Measurement of Spacecraft Molecular Contamination in Space |
MIL STD 1695 : 0
|
ENVIRONMENTS, WORKING, MINIMUM STANDARDS FOR |
DOD STD 347 : 0
|
PRODUCT ASSURANCE PROGRAM REQUIREMENTS FOR FIBER OPTIC COMPONENTS |
MIL F 48382 : A
|
FUZE, M934E6, IMPACT SWITCH FOR |
BS PD ES 59008-5.1 : 2001
|
DATA REQUIREMENTS FOR SEMICONDUCTOR DIE - PART 5-1: PARTICULAR REQUIREMENTS AND RECOMMENDATIONS FOR DIE TYPES - BARE DIE |
ASTM E 2090 : 2012 : REDLINE
|
Standard Test Method for Size-Differentiated Counting of Particles and Fibers Released from Cleanroom Wipers Using Optical and Scanning Electron Microscopy |
BS PD ES 59008-4.2 : 2001
|
DATA REQUIREMENTS FOR SEMICONDUCTOR DIE - PART 4-2: SPECIFIC REQUIREMENTS AND RECOMMENDATIONS - HANDLING AND STORAGE |
ASTM E 874 : 2011 : REDLINE
|
PRACTICE FOR ADHESIVE BONDING OF ALUMINUM FACINGS TO NONMETALLIC HONEYCOMB CORE FOR SHELTER PANELS |
ASTM F 816 : 1983 : R1998 : EDT 1
|
Standard Test Method for Combined Fine and Gross Leaks for Large Hybrid Microcircuit Packages |
ANSI INCITS 191 : 1991
|
INFORMATION SYSTEMS - RECORDED OPTICAL MEDIA UNIT FOR DIGITAL INFORMATION INTERCHANGE - 130 MM WRITE-ONCE SAMPLED-SERVO RZ SELECTABLE-PITCH OPTICAL DISK CARTRIDGE |
ANSI INCITS 246 : 1994
|
INFORMATION PROCESSING SYSTEMS - TEST METHODS FOR MEDIA CHARACTERISTICS OF 90 MM READ ONLY AND REWRITABLE M.O. OPTICAL DISK DATA STORAGE CARTRIDGE WITH DISCRETE BLOCK FORMAT (DBF) |
ASTM F 1394 : 1992 : R2012
|
Standard Test Method for Determination of Particle Contribution from Gas Distribution System Valves |
ASTM F 1394 : 1992 : R1999
|
Standard Test Method for Determination of Particle Contribution from Gas Distribution System Valves |
ASTM E 2352 : 2019
|
Standard Practice for Aerospace Cleanrooms and Associated Controlled Environments—Cleanroom Operations |
ASTM E 2042 : 2004
|
Standard Practice for Cleaning and Maintaining Controlled Areas and Clean Rooms |
ASTM E 2352 : 2004
|
Standard Practice for Aerospace Cleanrooms and Associated Controlled Environments-Cleanroom Operations |
ASTM E 1548 : 2009 : R2017
|
Standard Practice for Preparation of Aerospace Contamination Control Plans |
ASTM E 1548 : 2009
|
Standard Practice for Preparation of Aerospace Contamination Control Plans |
ASTM E 2042/E2042M : 2009
|
Standard Practice for Cleaning and Maintaining Controlled Areas and Clean Rooms |
ASTM A 380 : 2006
|
Standard Practice for Cleaning, Descaling, and Passivation of Stainless Steel Parts, Equipment, and Systems |
ASTM F 50 : 2012 : R2015
|
Standard Practice for Continuous Sizing and Counting of Airborne Particles in Dust-Controlled Areas and Clean Rooms Using Instruments Capable of Detecting Single Sub-Micrometre and Larger Particles |
ASME B89.6.2 : 1973 : R2017
|
TEMPERATURE AND HUMIDITY ENVIRONMENT FOR DIMENSIONAL MEASUREMENT |
ASME B89.6.2 : 1973 : R2003
|
TEMPERATURE AND HUMIDITY ENVIRONMENT FOR DIMENSIONAL MEASUREMENT |
ASME B89.6.2 : 1973 : R2012
|
TEMPERATURE AND HUMIDITY ENVIRONMENT FOR DIMENSIONAL MEASUREMENT |
MIL STD 1774 : 0
|
PROCESS FOR CLEANING HYDRAZINE SYSTEMS AND COMPONENTS |
ES 59008-5-2 : 2001
|
DATA REQUIREMENTS FOR SEMI-CONDUCTOR DIE - PART 5-2: PARTICULAR REQUIREMENTS AND RECOMMENDATIONS FOR DIE TYPES - BARE DIE WITH ADDED CONNECTION STRUCTURES |
MIL F 48863 : C
|
FUZE, GUIDED MISSILE, M934E6 PARTS ASSEMBLY, LOADING & PACKING FOR |
I.S. EN 14736:2004
|
SPACE PRODUCT ASSURANCE - QUALITY ASSURANCE FOR TEST CENTRES |
ASTM F 804 : 1983 : R1990 : EDT 1
|
Practice for Producing Spin Coating Resist Thickness Curves (Withdrawn 1997) |
MIL V 87223 : 0
|
VALVE, PRESSURE, ANTI-G SUIT, MXU-804/A AND MXU-805/A |
MIL I 81454 : 0
|
INDICATOR, GYROSCOPE, VERTICAL REFERENCE ID-1481 (*)/A |
MIL STD 1547 : B
|
ELECTRONIC PARTS, MATERIALS, AND PROCESSES FOR SPACE VEHICLES |
MIL G 81937 : A
|
GREASE, INSTRUMENT, ULTRA CLEAN, METRIC |
MIL HDBK 349 : 0
|
MANUFACTURE AND INSPECTION OF ADHESIVE BONDED, ALUMINUM HONEYCOMB SANDWICH ASSEMBLIES FOR AIRCRAFT |
MIL STD 1359 : B
|
CLEANING METHODS AND PROCEDURES FOR BREATHING OXYGEN EQUIPMENT |
MIL C 85300 : 0
|
COOLER, CRYOGENIC DETECTOR |
MIL R 28750 : C SUPP 1
|
RELAYS, SOLID STATE, SEALED, OPTICALLY ISOLATED, ZERO VOLTAGE TURN ON, 25 AMPERES, 250 VOLTS MAXIMUM, 45-440 HZ, POWER SWITCHING |
ASTM F 979 : 1986 : R2003
|
Standard Test Method for Hermeticity of Hybrid Microcircuit Packages Prior to Lidding (Withdrawn 2009) |
ES 59008-4-2 : 2000
|
DATA REQUIREMENTS FOR SEMICONDUCTOR DIE : SPECIFIC REQUIREMENTS AND RECOMMENDATIONS HANDLING AND STORAGE |
MIL B 913 : 0
|
BEARINGS, BALL, ANNULAR, FOR INSTRUMENTS AND PRECISION ROTATING COMPONENTS (METRIC) GENERAL SPECIFICATION FOR |
SAE AS 13591 : 2001
|
CLEANING METHODS &PROCEDURES FOR BREATHING OXYGEN EQUIPMENT |
PD ES 59008-2:1999
|
DATA REQUIREMENTS FOR SEMICONDUCTOR DIE - PART 2: VOCABULARY |
ASTM E 2088 : 2006 : R2015
|
Standard Practice for Selecting, Preparing, Exposing, and Analyzing Witness Surfaces for Measuring Particle Deposition in Cleanrooms and Associated Controlled Environments |
ASTM E 1549/E1549M : 2013 : R2016
|
Standard Specification for ESD Controlled Garments Required in Cleanrooms and Controlled Environments for Spacecraft for Non-Hazardous and Hazardous Operations |
SAE ARP 599 : 2013
|
AEROSPACE - DYNAMIC TEST METHOD FOR DETERMINING THE RELATIVE DEGREE OF CLEANLINESS OF THE DOWNSTREAM SIDE OF FILTER ELEMENTS |
NASA KSC STD Z 0010 : 1983
|
DESIGN OF ENVIRONMENTAL CONTROL SYSTEMS, GROUND COOLANT SYSTEMS, COOLANT SERVICING SYSTEMS, AND GROUND SUPPORT EQUIPMENT, STANDARD FOR |
MIL S 85333 : 0
|
SAFETY ARMING DEVICE MARK 33 MOD 1 |
ASTM F 691 : 1980 : R1991 : EDT 1
|
Practice for Preparing Photoplates for Measuring Flatness Deviation (Withdrawn 1996) |
CEI EN 62258-1 : 2011
|
SEMICONDUCTOR DIE PRODUCTS - PART 1: PROCUREMENT AND USE |
ASTM F 863 : 1984 : R1992 : EDT 1
|
Practice for Detection of Defects in Spin-Coated Resist (Withdrawn 1996) |
ASTM F 864 : 1984 : R1992
|
Practice for Inspection of Hardsurface Glass Photoplates (Withdrawn 1996) |
ASTM F 890 : 1984 : R1992
|
Practice for Determining Pinhole Density in Photoresist Films Used in Microelectronic Device Processing (Withdrawn 1996) |
MIL B 197 : F INT AMD 2
|
BEARINGS, ANTIFRICTION, ASSOCIATED PARTS AND SUBASSEMBLIES, PREPARATION FOR DELIVERY OF |
BS PD ES 59008-5.2 : 2001
|
DATA REQUIREMENTS FOR SEMICONDUCTOR DIE - PART 5-2: PARTICULAR REQUIREMENTS AND RECOMMENDATIONS FOR DIE TYPES - BARE DIE WITH ADDED CONNECTION STRUCTURES |
MIL F 48388 : A
|
FUZE, M934E6, LAUNCH SENSING SWITCH FOR |
MIL B 81793 : D
|
BEARING, BALL, PRECISION, FOR INSTRUMENTS AND ROTATING COMPONENTS |
ASTM F 849 : 1983 : R1988
|
Method for Identification and Test of Structures and Contaminants Seen on Polished Gadolinium Gallium Surfaces (Withdrawn 1992) |
MIL V 87255 : 0
|
VALVE, PRESSURE, ANTI-G SUIT, HIGH FLOW |
ASTM E 1731M : 1995
|
Standard Test Method for Gravimetric Determination of Nonvolatile Residue from Cleanroom Gloves [Metric] (Withdrawn 2000) |
ANSI INCITS 199 : 1991 : R2002
|
INFORMATION SYSTEMS - 356 MM OPTICAL DISK CARTRIDGE (WRITE-ONCE) - TEST METHODS FOR MEDIA CHARACTERISTICS |
ANSI INCITS 234 : 1993
|
INFORMATION SYSTEMS - TEST METHODS FOR MEDIA CHARACTERISTICS - 130 MM REWRITABLE OPTICAL DISK DATA STORAGE CARTRIDGES WITH CONTINUOUS COMPOSITE SERVO (CCS) |
ASTM E 2042/E2042M : 2009 : R2016
|
Standard Practice for Cleaning and Maintaining Controlled Areas and Clean Rooms |
ASTM E 2900 : 2012
|
Standard Practice for Spacecraft Hardware Thermal Vacuum Bakeout |
ASTM E 1235 : 2012 : REDLINE
|
Standard Test Method for Gravimetric Determination of Nonvolatile Residue (NVR) in Environmentally Controlled Areas for Spacecraft |
ASTM E 1235M : 1995
|
Test Method for Gravimetric Determination of Nonvolatile Residue (NVR) in Environmentally Controlled Areas for Spacecraft [Metric] (Withdrawn 2000) |
EN 14736:2004
|
Space product assurance - Quality assurance for test centres |
MIL G 23083 : C
|
GYROSCOPE, RATE SWITCHING MS 17399 |
ASTM F 416 : 1994
|
Test Method for Detection of Oxidation Induced Defects in Polished Silicon Wafers (Withdrawn 1998) |
NASA KSC SO S 9 : 1993
|
RETEST AND REFURBISHMENT OF COMPRESSED GAS TRAILERS AND MOVABLE STORAGE UNITS, STANDARD FOR |
DEFSTAN 18-1/2(1990) : 1990
|
GUIDELINES AND STANDARDS FOR THE PROCUREMENT OF MILITARY SPACECRAFT SYSTEMS |
MIL R 39023 : A
|
RESISTOR, VARIABLE, NON WIRE WOUND, PRECISION GENERAL SPECIFICATION FOR |
MIL STD 977 : 0
|
TEST METHODS AND PROCEDURES FOR MICROCIRCUIT LINE CERTIFICATION |
SAE AIR 4728 : 2013
|
REFERENCES, SPACECRAFT AND SPACECRAFT SERVICING, FLUID SYSTEM COMPONENTS (ABBREVIATIONS, ACRONYMS, DEFINITIONS, APPLICABLE DOCUMENTS AND ENVIRONMENTAL CONDITIONS) |
ES 59008-5-1 : 2001
|
DATA REQUIREMENTS FOR SEMI-CONDUCTOR DIE - PARTICULAR REQUIREMENTS AND RECOMMENDATIONS FOR DIE TYPES - BARE DIE |
MIL STD 2111 : 0
|
TECHNICAL REPAIR STANDARDS, ELECTRONIC (2Z/4G/7Z/7G REPAIRABLES), PREPARATION OF |
ASTM E 1234 : 2012 : REDLINE
|
Standard Practice for Handling, Transporting, and Installing Nonvolatile Residue (NVR) Sample Plates Used in Environmentally Controlled Areas for Spacecraft |
ASTM F 50 : 2012
|
Standard Practice for Continuous Sizing and Counting of Airborne Particles in Dust-Controlled Areas and Clean Rooms Using Instruments Capable of Detecting Single Sub-Micrometre and Larger Particles |
ASTM E 2352 : 2004 : R2010
|
Standard Practice for Aerospace Cleanrooms and Associated Controlled Environments-Cleanroom Operations |
IEC 62258-1:2009
|
Semiconductor die products - Part 1: Procurement and use |
BS EN 14736:2004
|
SPACE PRODUCT ASSURANCE - QUALITY ASSURANCE FOR TEST CENTRES |