USE OF SEMICONDUCTOR DEVICES OUTSIDE MANUFACTURERS' SPECIFIED TEMPERATURE RANGES

Available format(s)

Hardcopy , PDF

Language(s)

English

Published date

01-01-2001

Publisher

Government Electronics & Information Technology Association

1 Scope
2 References
3 Terms and Definitions
4 Objectives
5 Using Devices Outside the Manufacturer's Specified
Temperature Ranges
Annex A - Device Parameter Re-characterization
Annex B - Stress Balancing
Annex C - Parameter Conformance Assessment
Annex D - Higher Assembly Level Testing

Describes processes for using semiconductor devices in wider temperature ranges than those specified by the device manufacturer. Applies to any designer or manufacturer of equipment intended to operate under conditions that require semiconductor devices to function in temperature ranges beyond those for which the devices are marketed.

Committee	APMC
DocumentType	Standard
Pages	54
PublisherName	Government Electronics & Information Technology Association
Status	Current

IEC 60134:1961	Rating systems for electronic tubes and valves and analogous semiconductor devices
EIA 4899 : 2001	STANDARD FOR PREPARING AN ELECTRONIC COMPONENTS MANAGEMENT PLAN