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SEMICONDUCTOR DEVICES - MECHANICAL AND CLIMATIC TEST METHODS - PART 1: GENERAL

Available format(s)

Hardcopy , PDF

Language(s)

English

Published date

01-01-2003

Publisher

National Standards Authority of Ireland

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For Harmonized Standards, check the EU site to confirm that the Standard is cited in the Official Journal.

Only cited Standards give presumption of conformance to New Approach Directives/Regulations.

FOREWORD
INTRODUCTION
1 Scope
2 Normative references
3 Terms, definitions and letter symbols
4 Standard atmospheric conditions
5 Electrical measurements
6 Use of electrically defective devices

Applicable to semiconductor devices (discrete devices and integrated circuits) and establishes provisions common to all the other parts of the series.

DevelopmentNote	Supersedes I.S. EN 60749. (03/2006) For CENELEC adoptions of IEC publications, please check www.iec.ch to be sure that you have any corrigenda that may apply. (01/2017)
DocumentType	Standard
Pages	29
PublisherName	National Standards Authority of Ireland
Status	Current
Supersedes	I.S. EN 60749:1944

Standards	Relationship
IEC 60749-1:2002	Identical
NF EN 60749-1 : 2003	Identical
EN 60749-1:2003	Identical
DIN EN 60749-1:2003-12	Identical
UNE-EN 60749-1:2004	Identical
BS EN 60749-1:2003	Identical
SN EN 60749-1 : 2003	Identical
NBN EN 60749-1 : 2004	Identical