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I.S. EN 60749-29:2011

Current
Current

The latest, up-to-date edition.

SEMICONDUCTOR DEVICES - MECHANICAL AND CLIMATIC TEST METHODS - PART 29: LATCH-UP TEST
Available format(s)

Hardcopy , PDF

Language(s)

English

Published date

01-01-2011

Preview

For Harmonized Standards, check the EU site to confirm that the Standard is cited in the Official Journal.

Only cited Standards give presumption of conformance to New Approach Directives/Regulations.

FOREWORD
1 Scope and object
2 Terms and definitions
3 Classification and levels
4 Apparatus and material
5 Procedure
6 Failure criteria
7 Summary
Annex A (informative) - Examples of special pins
        that are connected to passive components
Annex B (informative) - Calculation of operating
        ambient or operating case temperature for
        a given operating junction temperature

Specifies the I-test and the overvoltage latch-up testing of integrated circuits. It establishes a method for determining integrated circuit latch-up characteristics and to define latch-up failure criteria.

DevelopmentNote
For CENELEC adoptions of IEC publications, please check www.iec.ch to be sure that you have any corrigenda that may apply. (01/2017)
DocumentType
Standard
Pages
27
PublisherName
National Standards Authority of Ireland
Status
Current

Standards Relationship
UNE-EN 60749-29:2004 Identical
NF EN 60749-29 : 2012 Identical
DIN EN 60749-29:2012-01 Identical
NBN EN 60749-29 : 2011 Identical
EN 60749-29:2011 Identical
IEC 60749-29:2011 Identical
BS EN 60749-29:2011 Identical

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