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I.S. EN 60749-3:2017

Current
Current

The latest, up-to-date edition.

SEMICONDUCTOR DEVICES - MECHANICAL AND CLIMATIC TEST METHODS - PART 3: EXTERNAL VISUAL EXAMINATION
Available format(s)

Hardcopy , PDF

Language(s)

English

Published date

01-01-2017

Preview

For Harmonized Standards, check the EU site to confirm that the Standard is cited in the Official Journal.

Only cited Standards give presumption of conformance to New Approach Directives/Regulations.

National Foreword
FOREWORD
1 Scope
2 Normative references
3 Terms and definitions
4 Test apparatus
5 Procedure
6 Failure criteria
7 Summary
Annex A (informative) - External visual report form/checklist
        (example only not a mandatory template)
Bibliography
Annex ZA (normative) - Normative references to international
         Publications with their corresponding
         European publications

Defines the materials, design, construction, markings, and workmanship of a semiconductor device are in accordance with the applicable procurement document.

DevelopmentNote
For CENELEC adoptions of IEC publications, please check www.iec.ch to be sure that you have any corrigenda that may apply. (01/2017)
DocumentType
Standard
Pages
26
PublisherName
National Standards Authority of Ireland
Status
Current

Standards Relationship
EN 60749-3:2017 Identical
DIN EN 60749-3:2003-04 Identical
UNE-EN 60749-3:2003 Identical
NBN EN 60749-3 : 2003 Identical
NF EN 60749-3 : 2002 Identical
BS EN 60749-3:2002 Identical
BS EN 60749-3:2017 Identical

EN 61340-5-1:2016/AC:2017-05 ELECTROSTATICS - PART 5-1: PROTECTION OF ELECTRONIC DEVICES FROM ELECTROSTATIC PHENOMENA - GENERAL REQUIREMENTS (IEC 61340-5-1:2016/COR1:2017)
IEC 61340-5-1:2016 Electrostatics - Part 5-1: Protection of electronic devices from electrostatic phenomena - General requirements
IEC 62483:2013 Environmental acceptance requirements for tin whisker susceptibility of tin and tin alloy surface finishes on semiconductor devices
IEC 60749-9:2017 Semiconductor devices - Mechanical and climatic test methods - Part 9: Permanence of marking

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