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SEMICONDUCTOR DEVICES - MECHANICAL AND CLIMATIC TEST METHODS - PART 31: FLAMMABILITY OF PLASTIC-ENCAPSULATED DEVICES (INTERNALLY INDUCED)

Available format(s)

Hardcopy , PDF

Language(s)

English

Published date

01-01-2003

Publisher

National Standards Authority of Ireland

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For Harmonized Standards, check the EU site to confirm that the Standard is cited in the Official Journal.

Only cited Standards give presumption of conformance to New Approach Directives/Regulations.

FOREWORD
INTRODUCTION
1 Scope and object
2 Normative references
3 Test procedure

Pertains to semiconductor devices (discrete devices and integrated circuits). Also determines whether the device ignites due to internal heating caused by excessive overloads.

DevelopmentNote	NSAI reissued 2003 PDF dated 19.02.2015 with IEC Corrigenda incorporated. (06/2017)
DocumentType	Standard
Pages	18
PublisherName	National Standards Authority of Ireland
Status	Current

Standards	Relationship
EN 60749-31:2003	Identical
SN EN 60749-31 : 2003	Identical
DIN EN 60749-31:2003-12	Identical
BS EN 60749-31:2003	Identical
UNE-EN 60749-31:2004	Identical
NBN EN 60749-31 : 2004	Identical
NF EN 60749-31 : 2003	Identical
IEC 60749-31:2002	Identical