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I.S. EN 61747-5:1999

Withdrawn
Withdrawn

A Withdrawn Standard is one, which is removed from sale, and its unique number can no longer be used. The Standard can be withdrawn and not replaced, or it can be withdrawn and replaced by a Standard with a different number.

LIQUID CRYSTAL AND SOLID-STATE DISPLAY DEVICES - PART 5: ENVIRONMENTAL, ENDURANCE AND MECHANICAL TEST METHODS
Available format(s)

Hardcopy , PDF

Withdrawn date

08-10-2013

Language(s)

English

Published date

04-06-1999

Preview

For Harmonized Standards, check the EU site to confirm that the Standard is cited in the Official Journal.

Only cited Standards give presumption of conformance to New Approach Directives/Regulations.

FOREWORD
1 General
  1.1 Scope and object
  1.2 Normative references
  1.3 Terms, definitions and letter symbols
  1.4 Standard atmospheric conditions
  1.5 Visual examination and verification of dimensions
  1.6 Electrical and optical measurements
  1.7 Electrical operating conditions
2 Mechanical test methods
  2.1 Robustness of terminations
  2.2 Soldering
  2.3 Vibration (sinusoidal)
  2.4 Shock
  2.5 Acceleration, steady state
  2.6 Bond strength test
3 Environmental and endurance test methods
  3.1 Change of temperature
  3.2 Storage (at high temperature)
  3.3 Storage (at low temperature)
  3.4 Low air pressure
  3.5 Damp heat, steady state
  3.6 Damp heat, cyclic (12+12-hour cycle)
  3.7 Composite temperature/humidity cyclic test support
  3.8 Light exposure
  3.9 ESD Test
4 Miscellaneous test methods
  4.1 Permanence of marking
  4.2 Scratch test (of face plate)
  4.3 Life test
5 Visual inspection of monochrome matrix liquid crystal
  display modules (Excluding all active matrix liquid crystal
  display modules)
  5.1 General
  5.2 Visual inspection of displays
6 Visual inspection of monochrome liquid crystal display cells
  (Excluding all active matrix liquid crystal display modules)
  6.1 General
  6.2 Visual inspection of displays
  6.3 Seal inspections
  6.4 Visual inspection of contact pad area
  6.5 Visual inspection for chipped material at the borders and
      edges of the plates of cells
Annex A (informative) - Cross references index
Annex ZA (normative) Normative references to international
                        publications with their corresponding
                        European publications

Gives test methods applicable to liquid crystal display devices.

DevelopmentNote
For CENELEC adoptions of IEC publications, please check www.iec.ch to be sure that you have any corrigenda that may apply. (01/2017) 1999 Edition is Partially Superseded by I.S. EN 61747-10-1. (07/2017)
DocumentType
Standard
Pages
88
PublisherName
National Standards Authority of Ireland
Status
Withdrawn

Standards Relationship
NF EN 61747-5 : 1999 Identical
DIN EN 61747-5:1999-02 Identical
EN 61747-5:1998 Identical
IEC 61747-5:1998 Identical
SN EN 61747-5 : 1998 Identical
NBN EN 61747-5 : 1999 Identical
BS EN 61747-5:1998 Identical

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HD 323.2.20 : 200S3 BASIC ENVIRONMENTAL TESTING PROCEDURES - TESTS - TEST T - SOLDERING
IEC 60068-1:2013 Environmental testing - Part 1: General and guidance
IEC 60068-2-27:2008 Environmental testing - Part 2-27: Tests - Test Ea and guidance: Shock
HD 323.2.13 : 200S1 BASIC ENVIRONMENTAL TESTING PROCEDURES - TESTS - TEST M: LOW AIR PRESSURE
IEC 60068-2-20:2008 Environmental testing - Part 2-20: Tests - Test T: Test methods for solderability and resistance to soldering heat of devices with leads
EN 60068-2-1:2007 Environmental testing - Part 2-1: Tests - Test A: Cold
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IEC 60068-2-21:2006 Environmental testing - Part 2-21: Tests - Test U: Robustness of terminations and integral mounting devices
IEC 60068-2-13:1983 Basic environmental testing procedures - Part 2-13: Tests - Test M: Low air pressure
EN 60068-1:2014 Environmental testing - Part 1: General and guidance
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IEC 60747-5:1992 Semiconductor devices - Discrete devices and integrated circuits -Part 5: Optoelectronic devices
IEC 60068-2-38:2009 Environmental testing - Part 2-38: Tests - Test Z/AD: Composite temperature/humidity cyclic test
HD 323.2.30 : 200S3 BASIC ENVIRONMENTAL TESTING PROCEDURES - PART 2: TESTS - TEST DB AND GUIDANCE: DAMP HEAT, CYCLIC (12 + 12-HOUR CYCLE)
EN 60068-2-27:2009 Environmental testing - Part 2-27: Tests - Test Ea and guidance: Shock
HD 323.2.3 : 200S2 BASIC ENVIRONMENTAL TESTING PROCEDURES - TESTS - TEST CA - DAMP HEAT, STEADY STATE
IEC 60068-2-3:1969 Basic environmental testing procedures - Part 2-3: Tests - Test Ca: Damp heat, steady state
EN 60068-2-21:2006 Environmental testing - Part 2-21: Tests - Test U: Robustness of terminations and integral mounting devices
IEC 60068-2-2:2007 Environmental testing - Part 2-2: Tests - Test B: Dry heat
IEC 60747-1:2006+AMD1:2010 CSV Semiconductor devices - Part 1: General
IEC 60749:1996+AMD1:2000+AMD2:2001 CSV Semiconductor devices - Mechanical and climatic test methods
EN 60068-2-6:2008 Environmental testing - Part 2-6: Tests - Test Fc: Vibration (sinusoidal)
IEC 60748-1:2002 Semiconductor devices - Integrated circuits - Part 1: General
IEC 60068-2-1:2007 Environmental testing - Part 2-1: Tests - Test A: Cold
IEC 60068-2-14:2009 Environmental testing - Part 2-14: Tests - Test N: Change of temperature
EN 60068-2-45:1992/A1:1993 Environmental testing - Part 2: Tests - Test Xa and guidance: Immersion in cleaning solvents
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