I.S. EN 62047-26:2016
Current
The latest, up-to-date edition.
SEMICONDUCTOR DEVICES - MICRO-ELECTROMECHANICAL DEVICES - PART 26: DESCRIPTION AND MEASUREMENT METHODS FOR MICRO TRENCH AND NEEDLE STRUCTURES
Hardcopy , PDF
English
01-01-2016
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Only cited Standards give presumption of conformance to New Approach Directives/Regulations.
National Foreword
FOREWORD
1 Scope
2 Normative references
3 Terms and definitions
4 Description of trench structures in a micrometer scale
5 Description of needle structures in a micrometer scale
6 Measurement method
Annex A (informative) - Examples of measurement for
trench and needle structures in a micrometer scale
Annex B (informative) - Uncertainty in dimensional measurement
Bibliography
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