IEC 60950-1:2005+AMD1:2009+AMD2:2013 CSV
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Information technology equipment - Safety - Part 1: General requirements
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IEC GUIDE 107:2014
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Electromagnetic compatibility - Guide to the drafting of electromagnetic compatibility publications
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EN 60825-1:2014/AC:2017-06
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SAFETY OF LASER PRODUCTS - PART 1: EQUIPMENT CLASSIFICATION AND REQUIREMENTS (IEC 60825-1:2014)
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IEC 62007-1:2015
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Semiconductor optoelectronic devices for fibre optic system applications - Part 1: Specification template for essential ratings and characteristics
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IEC 60749-25:2003
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Semiconductor devices - Mechanical and climatic test methods - Part 25: Temperature cycling
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IEC 61300-2-48:2009
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Fibre optic interconnecting devices and passive components - Basic test and measurement procedures - Part 2-48: Tests - Temperature-humidity cycling
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IEC 61290-1-3:2015
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Optical amplifiers - Test methods - Part 1-3: Power and gain parameters - Optical power meter method
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IEC 60749-11:2002
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Semiconductor devices - Mechanical and climatic test methods - Part 11: Rapid change of temperature - Two-fluid-bath method
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EN 60950-1:2006/A2:2013
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INFORMATION TECHNOLOGY EQUIPMENT - SAFETY - PART 1: GENERAL REQUIREMENTS (IEC 60950-1:2005/A2:2013, MODIFIED)
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IEC 60825-1:2014
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Safety of laser products - Part 1: Equipment classification and requirements
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IEC 62007-2:2009
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Semiconductor optoelectronic devices for fibre optic system applications - Part 2: Measuring methods
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EN 60749-11:2002
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Semiconductor devices - Mechanical and climatic test methods - Part 11: Rapid change of temperature - Two-fluid-bath method
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IEC 60749-26:2013
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Semiconductor devices - Mechanical and climatic test methods - Part 26: Electrostatic discharge (ESD) sensitivity testing - Human body model (HBM)
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EN 60749-10:2002
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Semiconductor devices - Mechanical and climatic test methods - Part 10: Mechanical shock
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IEC 60749-7:2011
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Semiconductor devices - Mechanical and climatic test methods - Part 7: Internal moisture content measurement and the analysis of other residual gases
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EN 61300-2-4:1997
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Fibre optic interconnecting devices and passive components - Basic test and measurement procedures - Part 2-4: Tests - Fibre/cable retention
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IEC 60749-6:2017
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Semiconductor devices - Mechanical and climatic test methods - Part 6: Storage at high temperature
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IEC 62148-1:2017
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Fibre optic active components and devices - Package and interface standards - Part 1: General and guidance
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EN 60749-7:2011
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Semiconductor devices - Mechanical and climatic test methods - Part 7: Internal moisture content measurement and the analysis of other residual gases
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EN 60749-6:2017
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Semiconductor devices - Mechanical and climatic test methods - Part 6: Storage at high temperature
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EN 60749-26:2014
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Semiconductor devices - Mechanical and climatic test methods - Part 26: Electrostatic discharge (ESD) sensitivity testing - Human body model (HBM)
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IEC 60747-5-1:1997+AMD1:2001+AMD2:2002 CSV
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Discrete semiconductor devices and integrated circuits - Part 5-1: Optoelectronic devices - General
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IEC 61300-2-4:1995
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Fibre optic interconnecting devices and passive components - Basic test and measurement procedures - Part 2-4: Tests - Fibre/cable retention
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IEC 60749-10:2002
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Semiconductor devices - Mechanical and climatic test methods - Part 10: Mechanical shock
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EN 60749-25:2003
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Semiconductor devices - Mechanical and climatic test methods - Part 25: Temperature cycling
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IEC 62149-1:2011
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Fibre optic active components and devices - Performance standards - Part 1: General and guidance
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IEC 61300-2-19:2012
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Fibre optic interconnecting devices and passive components - Basic test and measurement procedures - Part 2-19: Tests - Damp heat (steady state)
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EN 61300-2-19:2013
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Fibre optic interconnecting devices and passive components - Basic test and measurement procedures - Part 2-19: Tests - Damp heat (steady state)
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IEC 60749-12:2002
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Semiconductor devices - Mechanical and climatic test methods - Part 12: Vibration, variable frequency
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EN 61300-2-48:2009
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Fibre optic interconnecting devices and passive components - Basic test and measurement procedures - Part 2-48: Tests - Temperature-humidity cycling
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EN 60749-12:2002
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Semiconductor devices - Mechanical and climatic test methods - Part 12: Vibration, variable frequency
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